G01R 1/00
|
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES - Details of instruments or arrangements of the types covered by groups or |
G01R 1/02
|
General constructional details |
G01R 1/04
|
Housings; Supporting members; Arrangements of terminals |
G01R 1/06
|
Measuring leads; Measuring probes |
G01R 1/07
|
Non contact-making probes |
G01R 1/08
|
Pointers; Scales; Scale illumination |
G01R 1/10
|
Arrangements of bearings |
G01R 1/12
|
Arrangements of bearings of strip or wire bearings |
G01R 1/14
|
Braking arrangements; Damping arrangements |
G01R 1/16
|
Magnets |
G01R 1/18
|
Screening arrangements against electric or magnetic fields, e.g. against earth's field |
G01R 1/20
|
Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments |
G01R 1/22
|
Tong testers acting as secondary windings of current transformers |
G01R 1/24
|
Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section |
G01R 1/26
|
Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section with linear movement of probe |
G01R 1/28
|
Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform |
G01R 1/30
|
Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier |
G01R 1/36
|
Overload-protection arrangements or circuits for electric measuring instruments |
G01R 1/38
|
Arrangements for altering the indicating characteristic, e.g. by modifying the air gap |
G01R 1/40
|
Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer |
G01R 1/42
|
Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer thermally operated |
G01R 1/44
|
Modifications of instruments for temperature compensation |
G01R 1/067
|
Measuring probes |
G01R 1/073
|
Multiple probes |
G01R 3/00
|
Apparatus or processes specially adapted for the manufacture of measuring instruments |
G01R 5/00
|
Instruments for converting a single current or a single voltage into a mechanical displacement |
G01R 5/02
|
Moving-coil instruments |
G01R 5/04
|
Moving-coil instruments with magnet external to the coil |
G01R 5/06
|
Moving-coil instruments with core magnet |
G01R 5/08
|
Moving-coil instruments with eccentrically-pivoted moving coil |
G01R 5/10
|
String galvanometers |
G01R 5/12
|
Loop galvanometers |
G01R 5/14
|
Moving-iron instruments |
G01R 5/16
|
Moving-iron instruments with pivoting magnet |
G01R 5/18
|
Moving-iron instruments with pivoting soft iron, e.g. needle galvanometer |
G01R 5/20
|
Induction instruments e.g. Ferraris instruments |
G01R 5/22
|
Thermoelectric instruments |
G01R 5/24
|
Thermoelectric instruments operated by elongation of a strip or wire or by expansion of a gas or fluid |
G01R 5/26
|
Thermoelectric instruments operated by deformation of a bimetallic element |
G01R 5/28
|
Electrostatic instruments |
G01R 5/30
|
Leaf electrometers |
G01R 5/32
|
Wire electrometers; Needle electrometers |
G01R 5/34
|
Quadrant electrometers |
G01R 7/00
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement |
G01R 7/02
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a sum or a difference |
G01R 7/04
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient |
G01R 7/06
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient moving-iron type |
G01R 7/08
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient moving-coil type, e.g. crossed-coil type |
G01R 7/10
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming a quotient moving-coil type, e.g. crossed-coil type having more than two moving coils |
G01R 7/12
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product |
G01R 7/14
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product moving-iron type |
G01R 7/16
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product having both fixed and moving coils, i.e. dynamometers |
G01R 7/18
|
Instruments capable of converting two or more currents or voltages into a single mechanical displacement for forming product having both fixed and moving coils, i.e. dynamometers with iron core magnetically coupling fixed and moving coils |
G01R 9/00
|
Instruments employing mechanical resonance |
G01R 9/02
|
Vibration galvanometers, e.g. for measuring current |
G01R 9/04
|
Instruments employing mechanical resonance using vibrating reeds, e.g. for measuring frequency |
G01R 9/06
|
Instruments employing mechanical resonance using vibrating reeds, e.g. for measuring frequency magnetically driven |
G01R 9/08
|
Instruments employing mechanical resonance using vibrating reeds, e.g. for measuring frequency piezo-electrically driven |
G01R 11/00
|
Electromechanical arrangements for measuring time integral of electric power or current, e.g. of consumption |
G01R 11/02
|
Constructional details |
G01R 11/04
|
Housings; Supporting racks; Arrangements of terminals |
G01R 11/06
|
Magnetic circuits of induction meters |
G01R 11/09
|
Disc armatures |
G01R 11/10
|
Braking magnets; Damping arrangements |
G01R 11/12
|
Arrangements of bearings |
G01R 11/14
|
Arrangements of bearings with magnetic relief |
G01R 11/16
|
Adaptations of counters to electricity meters |
G01R 11/17
|
Compensating for errors; Adjusting or regulating means therefor |
G01R 11/18
|
Compensating for variations in ambient conditions |
G01R 11/19
|
Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters |
G01R 11/20
|
Compensating for phase errors in induction meters |
G01R 11/21
|
Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range |
G01R 11/22
|
Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques |
G01R 11/23
|
Compensating for errors caused by friction, e.g. adjustment in the light-load range |
G01R 11/24
|
Arrangements for avoiding or indicating fraudulent use |
G01R 11/25
|
Arrangements for indicating or signalling faults |
G01R 11/30
|
Dynamo-electric motor meters |
G01R 11/32
|
Watt-hour meters |
G01R 11/34
|
Ampère-hour meters |
G01R 11/36
|
Induction meters, e.g. Ferraris meters |
G01R 11/38
|
Induction meters, e.g. Ferraris meters for single-phase operation |
G01R 11/40
|
Induction meters, e.g. Ferraris meters for polyphase operation |
G01R 11/42
|
Circuitry therefor |
G01R 11/46
|
Electrically-operated clockwork meters; Oscillatory meters; Pendulum meters |
G01R 11/48
|
Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy |
G01R 11/50
|
Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy for measuring real component |
G01R 11/52
|
Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy for measuring reactive component |
G01R 11/54
|
Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy |
G01R 11/56
|
Special tariff meters |
G01R 11/57
|
Multi-rate meters |
G01R 11/58
|
Tariff-switching devices therefor |
G01R 11/60
|
Subtraction meters; Meters measuring maximum or minimum-load hours |
G01R 11/63
|
Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded |
G01R 11/64
|
Maximum meters, e.g. tariff for a period is based on maximum demand within that period |
G01R 11/66
|
Circuitry |
G01R 11/067
|
Coils therefor |
G01R 11/073
|
Armatures therefor |
G01R 11/185
|
Temperature compensation |
G01R 13/00
|
Arrangements for displaying electric variables or waveforms |
G01R 13/02
|
Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form |
G01R 13/04
|
Arrangements for displaying electric variables or waveforms for producing permanent records |
G01R 13/06
|
Modifications for recording transient disturbances, e.g. by starting or accelerating a recording medium |
G01R 13/08
|
Electromechanical recording system using a mechanical direct-writing method |
G01R 13/10
|
Electromechanical recording system using a mechanical direct-writing method with intermittent recording by representing the variable by the length of a stroke or by the position of a dot |
G01R 13/12
|
Chemical recording, e.g. clydonographs |
G01R 13/14
|
Recording on a light-sensitive material |
G01R 13/16
|
Recording on a magnetic medium |
G01R 13/18
|
Recording on a magnetic medium using boundary displacement |
G01R 13/20
|
Cathode-ray oscilloscopes |
G01R 13/22
|
Circuits therefor |
G01R 13/24
|
Time-base deflection circuits |
G01R 13/26
|
Circuits for controlling the intensity of the electron beam |
G01R 13/28
|
Circuits for simultaneous or sequential presentation of more than one variable |
G01R 13/30
|
Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking |
G01R 13/32
|
Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for synchronisation; Circuits for time-base expansion |
G01R 13/34
|
Circuits for representing a single waveform by sampling, e.g. for very high frequencies |
G01R 13/36
|
Arrangements for displaying electric variables or waveforms using length of glow discharge, e.g. glowlight oscilloscopes |
G01R 13/38
|
Arrangements for displaying electric variables or waveforms using the steady or oscillatory displacement of a light beam by an electromechanical measuring system |
G01R 13/40
|
Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect |
G01R 13/42
|
Instruments using length of spark discharge, e.g. by measuring maximum separation of electrodes to produce spark |
G01R 15/00
|
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES - Details of measuring arrangements of the types provided for in groups , or |
G01R 15/04
|
Voltage dividers |
G01R 15/06
|
Voltage dividers having reactive components, e.g. capacitive transformer |
G01R 15/08
|
Circuits for altering the measuring range |
G01R 15/09
|
Autoranging circuits |
G01R 15/12
|
Circuits for multi-testers, e.g. for measuring voltage, current, or impedance at will |
G01R 15/14
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks |
G01R 15/16
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices |
G01R 15/18
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers |
G01R 15/20
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices |
G01R 15/22
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers |
G01R 15/24
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices |
G01R 15/26
|
Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using modulation of waves other than light, e.g. radio or acoustic waves |
G01R 17/00
|
Measuring arrangements involving comparison with a reference value, e.g. bridge |
G01R 17/02
|
Arrangements in which the value to be measured is automatically compared with a reference value |
G01R 17/04
|
Arrangements in which the value to be measured is automatically compared with a reference value in which the reference value is continuously or periodically swept over the range of values to be measured |
G01R 17/06
|
Automatic balancing arrangements |
G01R 17/08
|
Automatic balancing arrangements in which a force or torque representing the measured value is balanced by a force or torque representing the reference value |
G01R 17/10
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc measuring bridges |
G01R 17/12
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc measuring bridges using comparison of currents, e.g. bridges with differential current output |
G01R 17/14
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc measuring bridges with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge |
G01R 17/16
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc measuring bridges with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier |
G01R 17/18
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc measuring bridges with more than four branches |
G01R 17/20
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc potentiometric measuring arrangements |
G01R 17/22
|
Measuring arrangements involving comparison with a reference value, e.g. bridge ac or dc potentiometric measuring arrangements with indication of measured value by calibrated null indicator |
G01R 19/00
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof |
G01R 19/02
|
Measuring effective values, i.e. root-mean-square values |
G01R 19/03
|
Measuring effective values, i.e. root-mean-square values using thermoconverters |
G01R 19/04
|
Measuring peak values of ac or of pulses |
G01R 19/06
|
Measuring real component; Measuring reactive component |
G01R 19/08
|
Measuring current density |
G01R 19/10
|
Measuring sum, difference, or ratio |
G01R 19/12
|
Measuring rate of change |
G01R 19/14
|
Indicating direction of current; Indicating polarity of voltage |
G01R 19/15
|
Indicating the presence of current |
G01R 19/17
|
Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values giving an indication of the number of times this occurs |
G01R 19/18
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of dc into ac, e.g. with choppers |
G01R 19/20
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of dc into ac, e.g. with choppers using transductors |
G01R 19/22
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of ac into dc |
G01R 19/25
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques |
G01R 19/28
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof adapted for measuring in circuits having distributed constants |
G01R 19/30
|
Measuring the maximum or the minimum value of current or voltage reached in a time interval |
G01R 19/32
|
Compensating for temperature change |
G01R 19/145
|
Indicating the presence of current or voltage |
G01R 19/155
|
Indicating the presence of voltage |
G01R 19/165
|
Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values |
G01R 19/175
|
Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero |
G01R 19/252
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency |
G01R 19/255
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency |
G01R 19/257
|
Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method |
G01R 21/00
|
Arrangements for measuring electric power or power factor |
G01R 21/01
|
Arrangements for measuring electric power or power factor in circuits having distributed constants |
G01R 21/02
|
Arrangements for measuring electric power or power factor by thermal methods |
G01R 21/04
|
Arrangements for measuring electric power or power factor by thermal methods in circuits having distributed constants |
G01R 21/06
|
Arrangements for measuring electric power or power factor by measuring current and voltage |
G01R 21/07
|
Arrangements for measuring electric power or power factor by measuring current and voltage in circuits having distributed constants |
G01R 21/08
|
Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices |
G01R 21/09
|
Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices in circuits having distributed constants |
G01R 21/10
|
Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance |
G01R 21/12
|
Arrangements for measuring electric power or power factor by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance in circuits having distributed constants |
G01R 21/14
|
Compensating for temperature change |
G01R 21/127
|
Arrangements for measuring electric power or power factor by using pulse modulation |
G01R 21/133
|
Arrangements for measuring electric power or power factor by using digital technique |
G01R 22/00
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters |
G01R 22/02
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electrolytic methods |
G01R 22/04
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by calorimetric methods |
G01R 22/06
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods |
G01R 22/08
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using analogue techniques |
G01R 22/10
|
Arrangements for measuring time integral of electric power or current, e.g. electricity meters by electronic methods using digital techniques |
G01R 23/00
|
Arrangements for measuring frequencies; Arrangements for analysing frequency spectra |
G01R 23/02
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage |
G01R 23/04
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage adapted for measuring in circuits having distributed constants |
G01R 23/06
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage |
G01R 23/07
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using response of circuits tuned on resonance, e.g. grid-drip meter |
G01R 23/08
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using response of circuits tuned off resonance |
G01R 23/09
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage |
G01R 23/10
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted |
G01R 23/12
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into phase shift |
G01R 23/14
|
Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by beat-frequency comparison |
G01R 23/15
|
Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements |
G01R 23/16
|
Spectrum analysis; Fourier analysis |
G01R 23/17
|
Spectrum analysis; Fourier analysis with optical auxiliary devices |
G01R 23/18
|
Spectrum analysis; Fourier analysis with provision for recording frequency spectrum |
G01R 23/20
|
Measurement of non-linear distortion |
G01R 23/163
|
Spectrum analysis; Fourier analysis adapted for measuring in circuits having distributed constants |
G01R 23/165
|
Spectrum analysis; Fourier analysis using filters |
G01R 23/167
|
Spectrum analysis; Fourier analysis using filters with digital filters |
G01R 23/173
|
Wobbulating devices similar to swept panoramic receivers |
G01R 23/175
|
Spectrum analysis; Fourier analysis by delay means, e.g. tapped delay lines |
G01R 23/177
|
Analysis of very low frequencies |
G01R 25/00
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents |
G01R 25/02
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents in circuits having distributed constants |
G01R 25/04
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference |
G01R 25/06
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents employing quotient instrument |
G01R 25/08
|
Arrangements for measuring phase angle between a voltage and a current or between voltages or currents by counting of standard pulses |
G01R 27/00
|
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom |
G01R 27/02
|
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant |
G01R 27/04
|
Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants |
G01R 27/06
|
Measuring reflection coefficients; Measuring standing-wave ratio |
G01R 27/08
|
Measuring resistance by measuring both voltage and current |
G01R 27/10
|
Measuring resistance by measuring both voltage and current using two-coil or crossed-coil instruments forming quotient |
G01R 27/12
|
Measuring resistance by measuring both voltage and current using two-coil or crossed-coil instruments forming quotient using hand generators, e.g. meggers |
G01R 27/14
|
Measuring resistance by measuring current or voltage obtained from a reference source |
G01R 27/16
|
Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line |
G01R 27/18
|
Measuring resistance to earth |
G01R 27/20
|
Measuring earth resistance; Measuring contact resistance of earth connections, e.g. plates |
G01R 27/22
|
Measuring resistance of fluids |
G01R 27/26
|
Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants |
G01R 27/28
|
Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response |
G01R 27/30
|
Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response with provision for recording characteristics, e.g. by plotting Nyquist diagram |
G01R 27/32
|
Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants |
G01R 29/00
|
Arrangements for measuring or indicating electric quantities not covered by groups |
G01R 29/02
|
Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration |
G01R 29/04
|
Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value |
G01R 29/06
|
Measuring depth of modulation |
G01R 29/08
|
Measuring electromagnetic field characteristics |
G01R 29/10
|
Radiation diagrams of antennas |
G01R 29/12
|
Measuring electrostatic fields |
G01R 29/14
|
Measuring field distribution |
G01R 29/16
|
Measuring asymmetry of polyphase networks |
G01R 29/18
|
Indicating phase sequence; Indicating synchronism |
G01R 29/20
|
Measuring number of turns; Measuring transformation ratio or coupling factor of windings |
G01R 29/22
|
Measuring piezoelectric properties |
G01R 29/24
|
Arrangements for measuring quantities of charge |
G01R 29/26
|
Measuring noise figure; Measuring signal-to-noise ratio |
G01R 29/027
|
Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values |
G01R 29/033
|
Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values giving an indication of the number of times this occurs |
G01R 31/00
|
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere |
G01R 31/01
|
Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station |
G01R 31/02
|
Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection |
G01R 31/04
|
Testing connections, e.g. of plugs or non-disconnectable joints |
G01R 31/06
|
Testing of electric windings, e.g. for polarity |
G01R 31/07
|
Testing of fuses |
G01R 31/08
|
Locating faults in cables, transmission lines, or networks |
G01R 31/10
|
Locating faults in cables, transmission lines, or networks by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme |
G01R 31/11
|
Locating faults in cables, transmission lines, or networks using pulse-reflection methods |
G01R 31/12
|
Testing dielectric strength or breakdown voltage |
G01R 31/14
|
Circuits therefor |
G01R 31/16
|
Construction of testing vessels; Electrodes therefor |
G01R 31/18
|
Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production |
G01R 31/20
|
Preparation of articles or specimens to facilitate testing |
G01R 31/24
|
Testing of discharge tubes |
G01R 31/25
|
Testing of vacuum tubes |
G01R 31/26
|
Testing of individual semiconductor devices |
G01R 31/27
|
Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements |
G01R 31/28
|
Testing of electronic circuits, e.g. by signal tracer |
G01R 31/30
|
Marginal testing, e.g. by varying supply voltage |
G01R 31/34
|
Testing dynamo-electric machines |
G01R 31/36
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] |
G01R 31/40
|
Testing power supplies |
G01R 31/42
|
AC power supplies |
G01R 31/44
|
Testing lamps |
G01R 31/50
|
Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections |
G01R 31/52
|
Testing for short-circuits, leakage current or ground faults |
G01R 31/54
|
Testing for continuity |
G01R 31/55
|
Testing for incorrect line connections |
G01R 31/56
|
Testing of electric apparatus |
G01R 31/58
|
Testing of lines, cables or conductors |
G01R 31/59
|
Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture |
G01R 31/60
|
Identification of wires in a multicore cable |
G01R 31/62
|
Testing of transformers |
G01R 31/64
|
Testing of capacitors |
G01R 31/66
|
Testing of connections, e.g. of plugs or non-disconnectable joints |
G01R 31/67
|
Testing the correctness of wire connections in electric apparatus or circuits |
G01R 31/68
|
Testing of releasable connections, e.g. of terminals mounted on a printed circuit board |
G01R 31/69
|
Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of sockets, e.g. wall sockets or power sockets in appliances |
G01R 31/70
|
Testing of connections between components and printed circuit boards |
G01R 31/71
|
Testing of solder joints |
G01R 31/72
|
Testing of electric windings |
G01R 31/74
|
Testing of fuses |
G01R 31/265
|
Contactless testing |
G01R 31/302
|
Contactless testing |
G01R 31/303
|
Contactless testing of integrated circuits |
G01R 31/304
|
Contactless testing of printed or hybrid circuits |
G01R 31/305
|
Contactless testing using electron beams |
G01R 31/306
|
Contactless testing using electron beams of printed or hybrid circuits |
G01R 31/307
|
Contactless testing using electron beams of integrated circuits |
G01R 31/308
|
Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation |
G01R 31/309
|
Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits |
G01R 31/311
|
Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits |
G01R 31/312
|
Contactless testing by capacitive methods |
G01R 31/315
|
Contactless testing by inductive methods |
G01R 31/316
|
Testing of analog circuits |
G01R 31/317
|
Testing of digital circuits |
G01R 31/319
|
Tester hardware, i.e. output processing circuits |
G01R 31/327
|
Testing of circuit interrupters, switches or circuit-breakers |
G01R 31/333
|
Testing of the switching capacity of high-voltage circuit-breakers |
G01R 31/364
|
Battery terminal connectors with integrated measuring arrangements |
G01R 31/367
|
Software therefor, e.g. for battery testing using modelling or look-up tables |
G01R 31/371
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with remote indication, e.g. on external chargers |
G01R 31/374
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with means for correcting the measurement for temperature or ageing |
G01R 31/378
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator |
G01R 31/379
|
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator for lead-acid batteries |
G01R 31/382
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC |
G01R 31/385
|
Arrangements for measuring battery or accumulator variables |
G01R 31/387
|
Determining ampere-hour charge capacity or SoC |
G01R 31/388
|
Determining ampere-hour charge capacity or SoC involving voltage measurements |
G01R 31/389
|
Measuring internal impedance, internal conductance or related variables |
G01R 31/392
|
Determining battery ageing or deterioration, e.g. state of health |
G01R 31/396
|
Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery |
G01R 31/3161
|
Marginal testing |
G01R 31/3163
|
Functional testing |
G01R 31/3167
|
Testing of combined analog and digital circuits |
G01R 31/3173
|
Marginal testing |
G01R 31/3177
|
Testing of logic operation, e.g. by logic analysers |
G01R 31/3181
|
Functional testing |
G01R 31/3183
|
Generation of test inputs, e.g. test vectors, patterns or sequences |
G01R 31/3185
|
Reconfiguring for testing, e.g. LSSD, partitioning |
G01R 31/3187
|
Built-in tests |
G01R 31/3193
|
Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response |
G01R 31/3828
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC using current integration |
G01R 31/3832
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC using current integration without measurement of battery voltage |
G01R 31/3835
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC involving only voltage measurements |
G01R 31/3842
|
Arrangements for monitoring battery or accumulator variables, e.g. SoC combining voltage and current measurements |
G01R 33/00
|
Arrangements or instruments for measuring magnetic variables |
G01R 33/02
|
Measuring direction or magnitude of magnetic fields or magnetic flux |
G01R 33/04
|
Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle |
G01R 33/05
|
Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle in thin-film element |
G01R 33/06
|
Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices |
G01R 33/07
|
Hall-effect devices |
G01R 33/09
|
Magneto-resistive devices |
G01R 33/10
|
Plotting field distribution |
G01R 33/12
|
Measuring magnetic properties of articles or specimens of solids or fluids |
G01R 33/14
|
Measuring or plotting hysteresis curves |
G01R 33/16
|
Measuring susceptibility |
G01R 33/18
|
Measuring magnetostrictive properties |
G01R 33/20
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance |
G01R 33/022
|
Measuring gradient |
G01R 33/24
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux |
G01R 33/025
|
Compensating stray fields |
G01R 33/26
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping |
G01R 33/028
|
Electrodynamic magnetometers |
G01R 33/30
|
Sample handling arrangements, e.g. sample cells, spinning mechanisms |
G01R 33/31
|
Temperature control thereof |
G01R 33/032
|
Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday |
G01R 33/34
|
Constructional details, e.g. resonators |
G01R 33/035
|
Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices |
G01R 33/36
|
Electrical details, e.g. matching or coupling of the coil to the receiver |
G01R 33/038
|
Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices |
G01R 33/42
|
Screening |
G01R 33/44
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR] |
G01R 33/46
|
NMR spectroscopy |
G01R 33/48
|
NMR imaging systems |
G01R 33/50
|
NMR imaging systems based on the determination of relaxation times |
G01R 33/54
|
Signal processing systems, e.g. using pulse sequences |
G01R 33/56
|
Image enhancement or correction, e.g. subtraction or averaging techniques |
G01R 33/58
|
Calibration of imaging systems, e.g. using test probes |
G01R 33/60
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance |
G01R 33/62
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using double resonance |
G01R 33/64
|
Arrangements or instruments for measuring magnetic variables involving magnetic resonance using cyclotron resonance |
G01R 33/341
|
Constructional details, e.g. resonators comprising surface coils |
G01R 33/343
|
Constructional details, e.g. resonators of slotted-tube or loop-gap type |
G01R 33/345
|
Constructional details, e.g. resonators of waveguide type |
G01R 33/381
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets |
G01R 33/383
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using permanent magnets |
G01R 33/385
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using gradient magnetic field coils |
G01R 33/387
|
Compensation of inhomogeneities |
G01R 33/389
|
Field stabilisation |
G01R 33/421
|
Screening of main or gradient magnetic field |
G01R 33/422
|
Screening of the radiofrequency field |
G01R 33/465
|
NMR spectroscopy applied to biological material, e.g. in vitro testing |
G01R 33/483
|
NMR imaging systems with selection of signal or spectra from particular regions of the volume, e.g. in vivo spectroscopy |
G01R 33/485
|
NMR imaging systems with selection of signal or spectra from particular regions of the volume, e.g. in vivo spectroscopy based on chemical shift information |
G01R 33/561
|
Image enhancement or correction, e.g. subtraction or averaging techniques by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences |
G01R 33/563
|
Image enhancement or correction, e.g. subtraction or averaging techniques of moving material, e.g. flow-contrast angiography |
G01R 33/565
|
Correction of image distortions, e.g. due to magnetic field inhomogeneities |
G01R 33/567
|
Image enhancement or correction, e.g. subtraction or averaging techniques gated by physiological signals |
G01R 33/3415
|
Constructional details, e.g. resonators comprising surface coils comprising arrays of sub-coils |
G01R 33/3815
|
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field using electromagnets with superconducting coils, e.g. power supply therefor |
G01R 33/3873
|
Compensation of inhomogeneities using ferromagnetic bodies |
G01R 33/3875
|
Compensation of inhomogeneities using correction coil assemblies, e.g. active shimming |
G01R 35/00
|
Testing or calibrating of apparatus covered by the other groups of this subclass |
G01R 35/02
|
Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating |
G01R 35/04
|
Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current |
G01R 35/06
|
Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current by stroboscopic methods |