- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/044 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
Patent holdings for IPC class G01N 23/044
Total number of patents in this class: 84
10-year publication summary
0
|
2
|
5
|
12
|
16
|
18
|
20
|
11
|
5
|
0
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
KUB Technologies, Inc., DBA Kubtec | 46 |
9 |
AIX Scan, Inc. | 10 |
8 |
Adaptix Limited | 72 |
7 |
Saki Corporation | 24 |
5 |
Massachusetts Institute of Technology | 9912 |
3 |
Hologic, Inc. | 1088 |
3 |
Koninklijke Philips N.V. | 23971 |
2 |
Omron Corporation | 7152 |
2 |
Toray Industries, Inc. | 6848 |
2 |
Shimadzu Corporation | 6010 |
2 |
Asahi Roentgen Ind. Co., Ltd. | 5 |
2 |
Job Corporation | 30 |
2 |
The Research Foundation for The State University of New York | 1550 |
2 |
Safran Aircraft Engines | 6031 |
2 |
AlxSCAN, Inc. | 3 |
2 |
General Electric Company | 17783 |
1 |
Hitachi High-Tech Science Corporation | 323 |
1 |
FUJIFILM Corporation | 28555 |
1 |
Nikon Corporation | 7126 |
1 |
Commissariat à l'énergie atomique et aux energies alternatives | 10694 |
1 |
Other owners | 26 |