Shin-Etsu Handotai Co., Ltd.

Japan

 
Total IP 1,273
Total IP Rank # 988
IP Activity Score 3.4/5.0    508
IP Activity Rank # 1,434
Parent Entity Shin-Etsu Chemical Co., Ltd.
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

417 2
0 0
850 4
0
 
Last Patent 2024 - Nitride semiconductor substrate ...
First Patent 1983 - Apparatus for chemical etching o...
Last Trademark 2023 - IG-NANA
First Trademark 2000 - EP-NANA

Subsidiaries

1 subsidiaries without IP

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Industry (Nice Classification)

Latest Inventions, Goods, Services

2023 Invention Debris determination method. The present invention is a method for determining the presence or ab...
Invention Method for producing bonded wafer for micro leds. The present invention provides a method for pro...
Invention Method for producing silicon substrate for quantum computers, silicon substrate for quantum compu...
Invention Susceptor for epitaxial growth and method for manufacturing epitaxial wafer. The present inventio...
Invention Single crystal silicon substrate equipped with nitride semiconductor layer, and method for manufa...
Invention Micro-led characteristics evaluation wafer and micro-led characteristics evaluation method. The p...
Invention Nitride semiconductor substrate and method for producing same. The present invention is a nitride...
Invention Method for manufacturing 3c-sic laminated substrate, 3c-sic laminated substrate, and 3c-sic indep...
Invention Bonded light-emitting element wafer and production method therefor. The present invention is a bo...
Invention Method for manufacturing epitaxial wafer. The present invention provides a method for manufacturi...
Invention Method for manufacturing light-receiving element. The present invention is a method for manufactu...
Invention Nitride semiconductor wafer and method for manufacturing same. The present invention relates to a...
Invention Method for producing silicon single crystal. The present invention provides a method for producin...
Invention Semiconductor wafer manufacturing method and semiconductor wafer. The present invention is a semi...
Invention Substrate for electronic device, and manufacturing method therefor. The present invention is a su...
Invention Method for dry etching single crystal silicon wafer, method for producing single crystal silicon ...
Invention Method for producing ground wafer and method for producing wafer. The present invention provides ...
Invention Method for producing heteroepitaxial wafer. The present invention is a method for producing a het...
Invention Method for growing diamond layer, and microwave plasma cvd device. The present invention is a met...
Invention Method for producing bonded light-emitting element wafer and method for transferring micro-led. T...
Invention Light emitting element and method for manufacturing same. The present invention is a light emitti...
G/S Semiconductor silicon wafers; Semiconductor silicon ingots sold as an integral component of semic...
Invention Member with heat spreader structure and method for producing same. The present invention provides...
Invention Resistivity measurement method. The present invention provides a resistivity measurement method f...
Invention Cleaning solution and wafer cleaning method. The present invention is a cleaning solution for cle...
Invention Double-sided polishing method. The present invention provides a double-sided polishing method inc...
Invention Cylinder grinding machine. The present invention pertains to a cylinder grinding machine that com...
Invention Epitaxial wafer. The present invention is an epitaxial wafer in which an epitaxial film made of a...
Invention Resistivity measurement device and resistivity measurement method. The present invention is a res...
Invention Method for producing light-emitting elements. x1-xy1-y1-yP (0 ≤ x < 1, 0.4 ≤ y ≤ 0.6), and a step...
Invention Method for producing polysilicon wafer. The present invention provides a method for producing a p...
Invention Epitaxial wafer and method for manufacturing epitaxial wafer. The present invention is an epitaxi...
Invention Group iii nitride semiconductor wafer, and manufacturing method thereof. 111), which is the dista...
Invention Substrate for electronic devices and method for producing same. The present invention provides a ...
2022 Invention Radio-frequency device substrate, and method for manufacturing same. The present invention is a r...
Invention Method of cleaning silicon wafer, method of manufacturing silicon wafer, and silicon wafer. A me...
Invention Nitride semiconductor substrate and method for producing the same. A nitride semiconductor subst...
Invention Nitride semiconductor substrate and manufacturing method therefor. A nitride semiconductor subst...
2021 Invention Method for producing an epitaxial wafer. The present invention is a method for producing an epit...
Invention Single crystal pulling apparatus and method for pulling single crystal. A single crystal pulling...
Invention Single crystal manufacturing apparatus. A single crystal manufacturing including: main chamber; ...
Invention Method for measuring distance between lower end surface of heat shielding member and surface of r...
Invention Inspection apparatus and inspection method. The present invention is an inspection apparatus for...
Invention Polishing pad, double-side polishing device, and double-side polishing method for wafer. The pre...
Invention Epitaxial wafer cleaning method. An epitaxial wafer cleaning method for cleaning a wafer having ...
Invention Epitaxial wafer for ultraviolet light emitting device, method for producing metal bonded substrat...
Invention Nitride semiconductor wafer and method for producing nitride semiconductor wafer. The present in...
Invention Method for producing semiconductor apparatus for quantum computer. A method produces a semicondu...
Invention Single-side polishing apparatus, single-side polishing method, and polishing pad. A single-side ...
Invention Substrate for group-iii nitride epitaxial growth and method for producing the same. A substrate ...
Invention Method for producing nitride semiconductor wafer and nitride semiconductor wafer. A method for p...
2000 G/S Semiconductor silicon wafers, semiconductor silicon ingots.