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2023
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Invention
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Testing apparatus, testing method, and computer-readable storage medium.
Provided is a testing a... |
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Invention
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Test system configuration adapter systems and methods.
Presented embodiments facilitate efficien... |
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Invention
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System and method for reserving cloud-based instrument.
A method for reserving a cloud-based ins... |
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Invention
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Automated test equipment comprising a device under test loopback and an automated test system wit... |
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Invention
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Over the air (ota) testing of an antenna in package (aip) device in radiating near field using a ... |
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Invention
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Pore device and fine particle measurement system.
A pore device is used with a measurement devic... |
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Invention
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Electronic component testing apparatus, sockets, and replacement parts for electronic component t... |
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Invention
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Signal generator.
N (N≥2) D/A converters convert respective input data at a sampling frequency F... |
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Invention
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Processor test pattern generation and application for tester systems.
A tester system includes a... |
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Invention
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Testing apparatus, testing system, testing method, and testing program. Provided is a testing app... |
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Invention
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Low power environment for high performance processor without low power mode.
A tester system inc... |
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Invention
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Memory queue operations to increase throughput in an ate system.
A tester system includes a test... |
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Invention
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Automatic test equipment.
An interface device is provided between a test head and a DUT. The int... |
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Invention
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Automatic test equipment.
An interface device is provided between a test head and a device under... |
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Invention
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Automatic test equipment.
An interface apparatus is provided between a test head and a DUT. The ... |
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Invention
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Automatic test equipment.
An interface device is provided between a test head and a DUT. In the ... |
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Invention
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Measurement arrangement for characterizing a radio frequency arrangement having a plurality of an... |
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Invention
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Control of an automated test equipment based on temperature.
Embodiments according to the disclo... |
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Invention
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Apparatus for testing a device under test separating errors within a received pattern associated ... |
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Invention
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Heater drive controlling apparatus, electronic component handling apparatus, electronic component... |
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Invention
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Power supply apparatus.
Power supply units of multiple channels each include an output stage tha... |
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Invention
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Test arrangement for over-the-air testing an angled device under test in a device-under-test sock... |
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Invention
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Test arrangement for over-the-air testing an angled device under test using a carrier structure w... |
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Invention
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Test arrangement for over-the-air testing an angled device under test that is tilted relative to ... |
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Invention
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Ultrasonic measurement apparatus, method, and recording medium.
An ultrasonic measurement appara... |
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Invention
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Management of hot add in a testing environment for duts that are cxl protocol enabled.
Efficient... |
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Invention
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Cxl protocol enablement for test environment systems and methods.
Efficient and effective testin... |
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Invention
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Systems and methods for testing cxl enabled devices in parallel.
Efficient and effective testing... |
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Invention
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Systems and methods utilizing dax memory management for testing cxl protocol enabled devices.
Ef... |
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Invention
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Test method and manufacturing method.
Provided is a test method including: placing, on a placeme... |
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Invention
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Test method, manufacturing method, panel level package, and test apparatus.
Provided is a test m... |
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Invention
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Signal/noise determination apparatus, method, and recording medium.
A signal/noise determination... |
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Invention
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Light beam diameter measurement device, method, program, recording medium. A light beam diameter ... |
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Invention
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Systems and methods of testing devices using cxl for increased parallelism.
Embodiments of the p... |
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Invention
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Image output device, method, program, and recording medium. This image output device comprises a ... |
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2022
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Invention
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Automated test equipment, method for testing a device under test and computer program using a fit... |
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Invention
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Automated test equipment, method for testing a device under test and computer program using an it... |
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Invention
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An antenna device and an automated test equipment. The invention describes an antenna device, com... |
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Invention
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A pusher for use in an automated test equipment and method for mechanically pushing a device unde... |
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Invention
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A pusher and a method for pushing a device under test with a single-linearly polarized antenna in... |
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Invention
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Amplifier arrangement and method for amplifier arrangement with set current at control input of t... |
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Invention
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Connecting device, testing device, and communication device. This connecting device comprises a f... |
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Invention
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Heat exchanger, electronic component handling device, and electronic component testing device. A ... |
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Invention
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Optical circuit and method. Provided is an optical circuit (10) equipped with: an optical switch ... |
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Invention
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Photoacoustic wave measurement device, method, program, and recording medium. In the present inve... |
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Invention
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Bias circuit. In the present invention, a frequency band on the low-frequency side of an output o... |
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Invention
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Optical element. The present invention decreases resistance between an electrode and a slot (rece... |
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Invention
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Signal vector derivation apparatus, method, program, and recording medium.
A signal vector deriv... |
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Invention
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Magnetic field measuring apparatus.
A magnetic field measuring apparatus for measuring a to-be-m... |
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2021
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G/S
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Downloadable and recorded computer software for controlling the operation of semiconductor testin... |
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G/S
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Computer software for controlling the operation of
semiconductor testing machines. |
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2020
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Invention
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Electronic component handling apparatus, electronic component testing apparatus, electronic compo... |
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G/S
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Semiconductor testing machines; system large scale integrated circuits testing machines; large sc... |
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G/S
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Semiconductor testing machines; system large scale
integrated circuits testing machines; large s... |
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2018
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G/S
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Wireless data loggers; temperature indicators; strain gauges; voltmeters; hygrometers; pressure g... |
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G/S
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Measuring or testing machines and instruments; computer
software; wireless data loggers; tempera... |
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2016
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G/S
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Photoacoustic microscope. |
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2013
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G/S
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Rental of semiconductor testing machines and system and
their parts and fitting; design, install... |
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G/S
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Rental of semiconductor testing machines and system and their parts and fitting; design, installa... |
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2012
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G/S
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Machines to test semiconductors, machines to test system large scale integrated circuits, machine... |
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G/S
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Optical inspection apparatus for inspection and testing of
semiconductor materials, namely, phot... |
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G/S
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Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo... |
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2010
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G/S
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Computer software used for the operation and control of photomask inspection and testing machines... |
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G/S
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Computer software for photomask inspection or testing
machines and systems; computer software; p... |
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2007
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G/S
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Semiconductor testing machines, system large scale integrated circuits testing machines, large sc... |
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G/S
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Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in... |
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2006
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G/S
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Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument... |
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G/S
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Test systems and platforms consisting of computer hardware, firmware, software and instruments fo... |
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2005
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G/S
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Measuring or testing machines and instruments; electric or
magnetic meters and testers; telecomm... |
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G/S
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Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e... |
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2001
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G/S
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[MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE... |
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2000
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G/S
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Semiconductor manufacturing machines, integrated circuit manufacturing machines |
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G/S
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Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ... |
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1998
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G/S
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Computer software used for data conversion, namely, for converting information developed in the d... |
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1992
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G/S
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LSI test systems, namely, groupings of equipment for testing the function and performance of elec... |
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1985
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G/S
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Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy... |
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1981
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G/S
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Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large... |
