KLA Corporation

United States of America


 
Total IP 1,195
Total IP Rank # 1,058
IP Activity Score 3.8/5.0    1,626
IP Activity Rank # 433
Stock Symbol
ISIN US4824801009
Market Cap. 36,700M  (USD)
Industry Semiconductor Equipment & Materials
Sector Technology
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

654 69
0 0
445 14
13
 
Last Patent 2024 - System and method for acquiring ...
First Patent 2000 - Real-time evaluation of stress f...
Last Trademark 2024 - INSPECTWISE
First Trademark 1972 - MICROSENSE

Industry (Nice Classification)

Latest Inventions, Goods, Services

2024 G/S Downloadable and prerecorded computer software for use in process control and yield management fo...
2023 Invention System and method for determining post bonding overlay. A wafer shape metrology system includes ...
G/S Downloadable computer (simulation) software for identifying stochastic defects in semiconductor w...
Invention Back-illuminated sensor and a method of manufacturing a sensor using a silicon on insulator wafer...
Invention System and method for mitigating overlay distortion patterns caused by a wafer bonding tool. A s...
Invention Massive overlay metrology sampling with multiple measurement columns. A multi-column metrology t...
Invention System and method for acquiring alignment measurements of structures of a bonded sample. Systems ...
Invention Confocal chromatic metrology for euv source condition monitoring. A light source includes a rotat...
Invention Auto-focus sensor implementation for multi-column microscopes. An array of localized auto-focus s...
Invention Noise diagnostics for an electron beam inspection system with swathing. Parameters from an inspec...
Invention Multi-pitch grid overlay target for scanning overlay metrology. An overlay metrology system with ...
Invention Multi-pitch grid overlay target for scanning overlay metrology. An overlay metrology system with...
Invention Lithography mask repair by simulation of photoresist thickness evolution. A system for mask desig...
Invention Deep learning model-based alignment for semiconductor applications. Methods and systems for deep ...
Invention Lithography mask repair by simulation of photoresist thickness evolution. A system for mask desi...
Invention Methods and systems for systematic error compensation across a fleet of metrology systems based o...
Invention Photoluminescence for semiconductor yield related applications. Methods and systems for determini...
Invention Photoluminescence for semiconductor yield related applications. Methods and systems for determin...
Invention Metrology sampling plans for only out of specification detection. Methods and systems for determi...
Invention 3d profilometry with a linnik interferometer. Systems and methods for generating volumetric data ...
Invention Scatterometry overlay metrology with orthogonal fine-pitch segmentation. An overlay metrology tar...
Invention Metrology sampling plans for only out of specification detection. Methods and systems for determ...
Invention Detecting defects on specimens. Methods and systems for detecting defects on a specimen are provi...
Invention Miniature electron optical column with a large field of view. A miniature electron optical column...
Invention Method and system for cleaning optical elements in euv optical systems. A system and method for c...
Invention System and method for reducing sample noise using selective markers. An inspection is disclosed. ...
Invention Image modeling-assisted contour extraction. A wafer metrology tool, such as a scanning electron m...
Invention Metrology target for one-dimensional measurement of periodic misregistration. A metrology target...
Invention System and method for reducing sample noise using selective markers. An inspection is disclosed....
Invention Methods and systems for model-less, scatterometry based measurements of semiconductor structures....
Invention Micro-lens array for metal-channel photomultiplier tube. The effective quantum efficiency of a me...
Invention Deep learning model-based alignment for semiconductor applications. Methods and systems for deep...
Invention Reference image grouping in overlay metrology. An overlay metrology system may include a controll...
Invention System and method for determining target feature focus in image-based overlay metrology. A metrol...
2022 Invention Detecting defects on specimens. Methods and systems for detecting defects on a specimen are prov...
Invention High-resolution evaluation of optical metrology targets for process control. A metrology system ...
Invention System and method for acquiring alignment measurements of structures of a bonded sample. Systems...
Invention Confocal chromatic metrology for euv source condition monitoring. A light source includes a rota...
Invention Method and system for cleaning optical elements in euv optical systems. A system and method for ...
Invention Auto-focus sensor implementation for multi-column microscopes. An array of localized auto-focus ...
Invention Noise diagnostics for an electron beam inspection system with swathing. Parameters from an inspe...
Invention Methods and systems for x-ray scatterometry measurements employing a machine learning based elect...
Invention Scatterometry overlay metrology with orthogonal fine-pitch segmentation. An overlay metrology ta...
Invention 3d profilometry with a linnik interferometer. Systems and methods for generating volumetric data...
G/S Server hardware and computer hardware that utilizes various model-based and model-less machine le...
G/S Computer servers [computer hardware]; Computer hardware for network access servers; Computer hard...
Invention Miniature electron optical column with a large field of view. A miniature electron optical colum...
Invention Image modeling-assisted contour extraction. A wafer metrology tool, such as a scanning electron ...
Invention Method and system of image-forming multi-electron beams. A multi-electron beam system that forms...
Invention Unsupervised or self-supervised deep learning for semiconductor-based applications. Methods and ...
2021 G/S Apparatus and instruments for recording, transmitting, reproducing or processing sound, images or...
G/S Downloadable computer software platform for remote customer assistance, training, and communicati...
G/S Downloadable computer software platform for software startup, documentation, and customer engagem...
G/S Scientific, research, navigation, surveying, photographic, cinematographic, audiovisual, optical,...
2020 G/S Instruments for testing, inspecting, and characterizing physical properties of reticles and phot...
G/S Data analytics computer hardware and prerecorded and downloadable computer software for correcti...
G/S Downloadable and prerecorded computer software for use in process control and yield management f...
G/S Scientific, electrical and measuring apparatus and instruments for determining and analyzing phy...
G/S Computer hardware and downloadable and prerecorded computer software for use in process control ...
G/S Computer hardware and downloadable and prerecorded computer software all for testing, inspecting...
G/S Data analytics computer hardware and prerecorded and downloadable computer software for correctin...
G/S Downloadable computer simulation software used for monitoring, controlling, accelerating and imp...
G/S Computer hardware, namely, computer server blade units to be used in integrated circuits manufac...
G/S Scientific, electrical and measuring apparatus and instruments for determining and analyzing phys...
2019 G/S Computer hardware and downloadable and prerecorded computer software for use in process control a...
G/S Computer hardware and downloadable and prerecorded computer software all for testing, inspecting,...
G/S Downloadable computer simulation software used for monitoring, controlling, accelerating and impr...
G/S Computer hardware, namely, computer server blade units to be used in integrated circuits manufact...
Invention Systems and methods for metrology with layer-specific illumination spectra. A metrology system ma...
G/S Inspection system comprised of a laser, recorded computer software, and computer hardware for te...
G/S Computer hardware; computer hardware and software for testing, inspecting, characterizing, and pr...
G/S Inspection system comprised of a laser, recorded computer software, and computer hardware for tes...
2018 G/S Computer hardware; computer hardware and software for testing, inspecting, characterizing, and p...
G/S Computer hardware and software used for testing, inspecting, characterizing, and predicting physi...
G/S Instruments for testing, inspecting, and characterizing physical properties of semiconductors and...
G/S instruments for testing, inspecting, and characterizing physical properties of reticles; computer...
G/S Instruments for testing, inspecting, and characterizing physical properties of semiconductor wafe...
G/S Consulting services in the field of product inspection and testing for the semiconductor, integra...
G/S computer hardware and software used for testing, inspecting, characterizing, and predicting physi...
G/S instruments for testing, inspecting, and characterizing physical properties of semiconductor wafe...
G/S metrology system comprised of computer software and computer hardware for testing and characteriz...
2017 G/S Computer hardware; semiconductor and wafer defect inspection systems comprised of computer softwa...
2016 G/S photomask blank inspection tool in the nature of testing equipment comprised of computer hardware...
2015 G/S Computer hardware; semiconductor and wafer defect inspection systems; computer software for use i...
G/S Scientific instrumentation for mechanical property testing, namely, nanoindentation testing of th...
G/S Computer hardware for testing and inspecting physical and electrical properties of semiconductors...
2014 G/S Nanomechanical laboratory testing instruments, namely, nanoindentation testing instruments having...
2013 G/S Scientific instrumentation for measuring mechanical properties