The mass spectrometer includes a sample stage, an irradiation unit that irradiates the sample with an energy beam and ionizes a component of the sample, an extraction electrode that extracts the ionized sample from the surface of the sample by a potential difference from the sample stage, an MCP that emits electrons in accordance with the ionized sample, an imaging part that acquires an image based on the electrons emitted by the MCP, and a control unit that controls operations of the irradiation unit, the extraction electrode, and the imaging part. The control unit changes the potential of the extraction electrode at a timing in accordance with the detection target component after the irradiation of the energy beam by the irradiation unit, and causes the imaging part to acquire an image as an analysis target in a period in accordance with the detection target component.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
H01J 49/00 - Spectromètres pour particules ou tubes séparateurs de particules
2.
IMAGE ACQUISITION DEVICE, INSPECTION DEVICE, AND IMAGE ACQUISITION METHOD
An image acquisition device 1 comprises: an illumination device 2 that irradiates a subject S with light from the range of a light irradiation unit 2a; and an imaging device 7 that detects, through an imaging lens 7a, light that has been specularly reflected by the subject S. A straight line that connects the center of the light irradiation unit 2a with a point of intersection between the optical axis of the imaging lens 7a and the subject S is set to be inclined 2-120 degrees with respect to the optical axis. The solid angle of the light irradiation unit 2a as viewed from said point of intersection is set to be 0-0.15 steradians.
A scanning microscope unit includes: a light source for outputting irradiation light; a photodetector; a MEMS mirror for scanning an irradiation light over an observation object, and for guiding an observation light toward the photodetector; a scanning lens for guiding the irradiation light scanned by the MEMS mirror, to a microscope optical system, and for guiding the observation light imaged by the microscope optical system, to the MEMS mirror; and a frame member formed in a frame shape to define an opening, and disposed on a side of the microscope optical system with respect to the scanning lens such that the irradiation light and the observation light pass through the opening. The frame member includes a calibration portion provided in a side portion defining the opening, and for generating calibration light including a sensitivity wavelength of the photodetector in response to an incidence of the irradiation light.
An image acquisition device 1 comprises: an illumination device 2 for irradiating an object S with polarized light; an image capture device 7 for detecting light that is the polarized light directly reflected by the object S and acquiring a plurality of pieces of image data on mutually different polarization components of the light; and an image processing device 8 for detecting, on the basis of the plurality of pieces of image data, foreign matter that is present on the object S and through which the polarized light passes.
An optical device includes a support portion, a first movable portion having an optical surface, a second movable portion having a frame shape and surrounding the first movable portion, a first coupling portion coupling the first movable portion and the second movable portion to each other, a second coupling portion coupling the second movable portion and the support portion to each other, and a softening member which has a softening characteristic and to which stress is applied when the first movable portion swings around a first axis. When viewed in a direction perpendicular to the optical surface, the softening member is provided to a portion of the second movable portion, the portion extending between a drive element and the first coupling portion, and is not electrically connected to an outside.
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
B81B 3/00 - Dispositifs comportant des éléments flexibles ou déformables, p.ex. comportant des membranes ou des lamelles élastiques
A photodetector includes a first conduction-type semiconductor layer, a semiconductor light absorption layer provided on the first conduction-type semiconductor layer, and a second conduction-type semiconductor layer provided on the semiconductor light absorption layer. Inside the semiconductor light absorption layer, finely modified portions forming a localized inhomogeneous electric field inside the semiconductor light absorption layer by scattering incident light are provided in a manner of being separated from the second conduction-type semiconductor layer.
This image acquisition method includes: a step for repeatedly generating a group of excitation light pulses including a plurality of excitation light pulses; a step for irradiating the target object containing a fluorescent dye with the group of excitation light pulses; a step for detecting the intensity of fluorescence generated at a plurality of locations of the target object by the irradiation with the group of excitation light pulses; and a step for generating a fluorescence image on the basis of the intensity of fluorescence at the plurality of locations of the target object. In the step for generating a group of excitation light pulses, the time interval between the plurality of excitation light pulses is set to be equal to or less than the relaxation time between excited states in the excited triplet state of the fluorescent dye, or shorter than 10 picoseconds.
A film thickness measuring apparatus measures a film thickness of a sample during a manufacturing step. The film thickness measuring apparatus includes a lens focusing light (plasma light) generated in the manufacturing step and reflected by one surface of the sample, an inclined dichroic mirror having a transmissivity and a reflectivity changing in accordance with a wavelength in a predetermined wavelength region and separating light focused by the lens through transmission and reflection, an area sensor capturing an image of light separated by the inclined dichroic mirror, and a control apparatus estimating the film thickness of the sample on the basis of a signal from the area sensor capturing an image of light and obtaining a film thickness distribution on the one surface of the sample. Light reflected by the sample includes light having a wavelength included in the predetermined wavelength region of the inclined dichroic mirror.
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitement; Appareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants
10.
SOLID-STATE IMAGING DEVICE AND SIGNAL PROCESSING METHOD
This solid-state imaging device comprises: first and second light receiving units that each generate a charge in accordance with an incident light; an output unit that is to output a first signal in accordance with the charge occurring in the first light receiving unit and that is to output a second signal in accordance with the charge occurring in the second light receiving unit; and a signal processing unit that is to process the signals outputted from the output unit. The signal processing by the signal processing unit includes: addition signal generation processing that adds the first signal and the second signal together, thereby generating an addition signal; subtraction signal generation processing that subtracts the second signal from the first signal, thereby generating a subtraction signal; and correction processing that corrects, on the basis of the subtraction signal, and outputs the addition signal.
A photodetector (1) comprises: a package (2) having a bottom wall (21) and a window (23) facing each other; a light receiving element (4) disposed on the bottom wall (21) in the package (2); a light transmitting member (7) disposed on the light receiving element (4) in the package (2); and an optical filter member (8) disposed on the light transmitting member (7) in the package (2). The light receiving element (4) has a light receiving area (42) including a plurality of light receiving portions (41). When viewed from the direction in which the bottom wall (21) and the window (23) are facing each other, the outer edge of the light receiving element (4) is located inside the outer edge of the optical filter member (8).
H01L 31/0232 - Dispositifs à semi-conducteurs sensibles aux rayons infrarouges, à la lumière, au rayonnement électromagnétique d'ondes plus courtes, ou au rayonnement corpusculaire, et spécialement adaptés, soit comme convertisseurs de l'énergie dudit rayonnement e; Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives; Leurs détails - Détails Éléments ou dispositions optiques associés au dispositif
Deuterium lamps; deuterium lamps for use in analytical and measuring devices, and parts thereof; discharge lamps; laboratory lamps; discharge tubes, electric, for lighting.
A semiconductor laser element includes a first emitter having a first active layer and a first guide layer, and a second emitter having a second active layer and a second guide layer. A thickness of the first emitter is different from a thickness of the second emitter so that an average value of an index DB1 and an index DB2 represented by equations (1) and (2) is 5% or less,
A semiconductor laser element includes a first emitter having a first active layer and a first guide layer, and a second emitter having a second active layer and a second guide layer. A thickness of the first emitter is different from a thickness of the second emitter so that an average value of an index DB1 and an index DB2 represented by equations (1) and (2) is 5% or less,
[Equation 1]
A semiconductor laser element includes a first emitter having a first active layer and a first guide layer, and a second emitter having a second active layer and a second guide layer. A thickness of the first emitter is different from a thickness of the second emitter so that an average value of an index DB1 and an index DB2 represented by equations (1) and (2) is 5% or less,
[Equation 1]
DB1=∫|F1(θ)−F01(θ)|dθ (1)
A semiconductor laser element includes a first emitter having a first active layer and a first guide layer, and a second emitter having a second active layer and a second guide layer. A thickness of the first emitter is different from a thickness of the second emitter so that an average value of an index DB1 and an index DB2 represented by equations (1) and (2) is 5% or less,
[Equation 1]
DB1=∫|F1(θ)−F01(θ)|dθ (1)
[Equation 2]
A semiconductor laser element includes a first emitter having a first active layer and a first guide layer, and a second emitter having a second active layer and a second guide layer. A thickness of the first emitter is different from a thickness of the second emitter so that an average value of an index DB1 and an index DB2 represented by equations (1) and (2) is 5% or less,
[Equation 1]
DB1=∫|F1(θ)−F01(θ)|dθ (1)
[Equation 2]
DB2=∫|F2(θ)−F02(θ)|dθ (2)
A semiconductor laser element includes a first emitter having a first active layer and a first guide layer, and a second emitter having a second active layer and a second guide layer. A thickness of the first emitter is different from a thickness of the second emitter so that an average value of an index DB1 and an index DB2 represented by equations (1) and (2) is 5% or less,
[Equation 1]
DB1=∫|F1(θ)−F01(θ)|dθ (1)
[Equation 2]
DB2=∫|F2(θ)−F02(θ)|dθ (2)
F1(θ) is a far field pattern when it is assumed that only the first emitter is present, and F2(θ) is a far field pattern when it is assumed that only the second emitter is present. F01(θ) is a far field pattern of one of two modes corresponding to a fundamental mode of the light emitted from the first and second emitters, and F02(θ) is a far field pattern of the other one.
H01S 5/20 - Structure ou forme du corps semi-conducteur pour guider l'onde optique
H01S 5/02218 - Matériaux du boîtier; Matériaux de remplissage du boîtier
H01S 5/30 - Structure ou forme de la région active; Matériaux pour la région active
H01S 5/343 - Structure ou forme de la région active; Matériaux pour la région active comprenant des structures à puits quantiques ou à superréseaux, p.ex. lasers à puits quantique unique [SQW], lasers à plusieurs puits quantiques [MQW] ou lasers à hétérostructure de confinement séparée ayant un indice progressif [GRINSCH] dans des composés AIIIBV, p.ex. laser AlGaAs
H01S 5/40 - Agencement de plusieurs lasers à semi-conducteurs, non prévu dans les groupes
14.
RADIATION DETECTOR, RADIATION DETECTOR MANUFACTURING METHOD, AND SCINTILLATOR PANEL UNIT
A radiation detector includes a sensor panel having a light receiving surface, a first scintillator panel and a second scintillator panel disposed on the light receiving surface in a state of being adjacent to each other along the light receiving surface, and an adhesive layer. The first scintillator panel has a first substrate and a first scintillator layer including a plurality of columnar crystals. The second scintillator panel has a second substrate and a second scintillator layer including a plurality of columnar crystals. The first scintillator layer reaches at least a first portion of the first substrate. The second scintillator layer reaches at least a second portion of the second substrate. The adhesive layer is provided continuous over the first scintillator panel and the second scintillator panel.
A light-emitting diode element includes a semiconductor substrate having a first surface and a second surface on a side opposite to the first surface, a semiconductor lamination portion formed on the first surface of the semiconductor substrate, a first electrode connected to a part of the semiconductor lamination portion on the semiconductor substrate side, and a second electrode connected to a part of the semiconductor lamination portion on a side opposite to the semiconductor substrate. The semiconductor lamination portion includes an n-type semiconductor layer, an active layer having a p-type conductivity and laminated on the n-type semiconductor layer, and a p-type semiconductor layer laminated on the active layer on a side opposite to the n-type semiconductor layer. The active layer has a multiple quantum well structure constituted of barrier layers including AlInAs and well layers including InAsSb alternately laminated therein.
H01L 33/06 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails caractérisés par les corps semi-conducteurs ayant une structure à effet quantique ou un superréseau, p.ex. jonction tunnel au sein de la région électroluminescente, p.ex. structure de confinement quantique ou barrière tunnel
H01L 33/00 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails
H01L 33/30 - Matériaux de la région électroluminescente contenant uniquement des éléments du groupe III et du groupe V de la classification périodique
16.
IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD
An image processing device 1 comprises a processing unit 11 and a training unit 12, and performs noise reduction processing on an image 23 of interest. The processing unit 11 inputs an input image 21 to a CNN and outputs an output image 22 from the CNN. The training unit 12 uses an evaluation function based on the output image 22 and the image 23 of interest to train the CNN on the basis of the value of the evaluation function. The evaluation function includes an error evaluation term that represents an evaluation value related to an error between the output image and the image of interest, and a regularization term that represents an evaluation value related to the difference in pixel value between adjacent pixels in the output image. The image processing device 1 repeats the processing in the processing unit 11 and the processing in the training unit 12 multiple times, and the output image 22 obtained after a certain number of repetitions is taken as a noise-reduced image. Thus, an image processing device and an image processing method are achieved that make it possible to suppress image quality degradation due to CNN overlearning in noise reduction processing using DIP technology.
A61B 5/055 - Détection, mesure ou enregistrement pour établir un diagnostic au moyen de courants électriques ou de champs magnétiques; Mesure utilisant des micro-ondes ou des ondes radio faisant intervenir la résonance magnétique nucléaire [RMN] ou électronique [RME], p.ex. formation d'images par résonance magnétique
An image processing device (10) comprises a sinogram creating unit (11), a CNN processing unit (12), a convolution integration unit (13), a forward projection calculating unit (14), and a CNN training unit (15). The forward projection calculating unit (14) subjects an output image (23) to a forward projection calculation to create a calculated sinogram (24). The CNN training unit (15) uses an evaluation function including an error evaluation term representing an evaluation value relating to an error between an actual measured sinogram (21) and the calculated sinogram (24), and a regularization term representing an evaluation value relating to a difference in pixel values between adjacent pixels in the output image, to train a CNN on the basis of the values of the evaluation function. As a result, the present invention achieves an image processing device with which it is possible to obtain a tomographic image having reduced noise, by suppressing a deterioration in image quality resulting from CNN overfitting in noise reduction processing employing a DIP technique, when the CNN is trained on the basis of evaluation results of differences between the calculated sinogram and the actual measured sinogram to create a tomographic image of a subject.
A dispersion measurement apparatus includes a pulse forming unit, a correlation optical system, a beam splitter, an operation unit, an imaging unit, a spatial filter unit, and a photodetector. The pulse forming unit forms a light pulse train including light pulses having time differences and different center wavelengths. The beam splitter branches the light pulse train passed through a measurement object. The imaging unit disperses one light pulse train and images each light pulse. The spatial filter unit extracts light of a partial region of the other light pulse train. The correlation optical system outputs correlation light including a cross-correlation or an autocorrelation of the extracted light. The photodetector detects a temporal waveform of the correlation light. The operation unit estimates a wavelength dispersion amount in the measurement object based on a feature value of the temporal waveform.
A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The mirror device 20 is provided with a light passage portion 24 that constitutes a first portion of an optical path between the beam splitter unit 3 and the fixed mirror 16. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a second portion of the optical path between the beam splitter unit 3 and the fixed mirror 16. A second surface 21b of the base 21 and a third surface 13a of the optical function member 13 are joined to each other.
G02B 7/182 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour miroirs pour miroirs
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
G02B 27/14 - Systèmes divisant ou combinant des faisceaux fonctionnant uniquement par réflexion
This intraoral image capturing device comprises: a radiation detection unit that detects radiation; a first substrate that has provided thereto a communication element capable of conducting wireless communication with the outside; a second substrate that is provided with a battery and is disposed on the side opposite to the radiation detection unit across the first substrate; a connection member by which the second substrate is connected to the first substrate; and a housing in which the radiation detection unit, the first substrate, the second substrate, and the connection member are accommodated. When viewed in the Z direction, the entirety of the outer edge of the second substrate is positioned on the inner side of the outer edge of the first substrate.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Software development kit [SDK]; software development kit [SDK] for film thickness gauge; software development kit [SDK] for plasma-process monitor; application software; computer software programs; coating thickness gauge; Semiconductor inspection apparatus; semi-conductors; integrated circuits; photosensors; photonic multichannel analyzers; photoelectron energy spectrum analyzer, other than for medical use; photometers; spectrograph apparatus; spectrometers; spectrophotometers; spectrophotometers consisting of photosensors, spectroscopes and power supplies; sensors; electric sensors; measuring apparatus; measures; observation instruments; radiation sensing apparatus; spectroscopes; optical apparatus and instruments; detectors; plasma luminescence detectors; microscopes; electron microscopes; light source equipment for laboratory use; laboratory apparatus and instruments; telecommunications apparatus and instruments; monitors; monitoring apparatus, other than for medical purposes; plasma process monitor; computers; computer peripheral devices; apparatus for recording, transmission, or reproduction of sound, images, and data; regulating apparatus, electric.
23.
OPTICAL PULSE GENERATION DEVICE AND OPTICAL PULSE GENERATION METHOD
An optical pulse generation device includes an optical resonator of mode-locked type, a light source, and a waveform controller. The optical resonator includes an optical amplification medium and generates, amplifies, and outputs laser light. The light source is optically coupled to the optical resonator and supplies excitation light to the optical amplification medium. The waveform controller is arranged in the optical resonator, and controls a time waveform of the laser light within a predetermined period to convert the laser light into an optical pulse train including two or more optical pulses within a period of the optical resonator. The optical resonator amplifies the optical pulse train after the predetermined period and outputs the optical pulse train having amplified as the laser light.
H01S 3/1118 - Absorbeurs saturables à semi-conducteurs, p.ex. miroirs absorbeurs saturables à semi-conducteurs [SESAM]; Absorbeurs saturables à l'état solide, p.ex. à base de nanotubes de carbone [CNT]
H01S 3/102 - Commande de l'intensité, de la fréquence, de la phase, de la polarisation ou de la direction du rayonnement, p.ex. commutation, ouverture de porte, modulation ou démodulation par commande du milieu actif, p.ex. par commande des procédés ou des appareils pour l'excitation
An analysis apparatus includes a light emission unit configured to emit measurement light including light in a 900 nm wavelength band to a sample, a light detection unit configured to acquire spectrum data of reflected light in the sample, a data processing unit configured to perform a noise removing process on the spectrum data, a first determination unit configured to store a PLS regression model associated with prediction of an amount of triglyceride in the sample and to determine an amount of triglyceride in the sample by applying the spectrum data subjected to the noise removing process to the PLS regression model, and a second determination unit configured to store data indicating a correlation with an amount of triglyceride in the sample and to determine an amount of brown adipose tissue or beige fat in the sample based on the data and the amount of triglyceride determined by the first determination unit.
A61B 5/00 - Mesure servant à établir un diagnostic ; Identification des individus
G01J 3/42 - Spectrométrie d'absorption; Spectrométrie à double faisceau; Spectrométrie par scintillement; Spectrométrie par réflexion
G01N 21/3563 - Couleur; Propriétés spectrales, c. à d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p.ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse de solides; Préparation des échantillons à cet effet
25.
EMISSION OPTICAL SYSTEM, EMISSION DEVICE, AND OPTICAL MEASUREMENT DEVICE
An irradiation optical system configured to irradiate an object with first light includes: a light source including a surface emitting element emitting the first light from a light emitting surface; a light shaping member on which the first light emitted from the light source is incident via a light incidence surface and which shapes the incident first light using a light passing hole and emits the shaped first light; and a first lens configured to form an image of the first light emitted from the light shaping member on the object. A distance between the light emitting surface of the surface emitting element and the light incidence surface of the light shaping member is equal to or less than 26 times a size.
A photodetection element includes an N-type silicon layer formed in a single crystal state, a P-type germanium-containing layer formed in a polycrystal state and forming a hetero PN junction between the germanium-containing layer and the silicon layer, a first electrode electrically connected to the silicon layer, and a second electrode electrically connected to the germanium-containing layer.
H01L 31/0368 - Dispositifs à semi-conducteurs sensibles aux rayons infrarouges, à la lumière, au rayonnement électromagnétique d'ondes plus courtes, ou au rayonnement corpusculaire, et spécialement adaptés, soit comme convertisseurs de l'énergie dudit rayonnement e; Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives; Leurs détails caractérisés par leurs corps semi-conducteurs caractérisés par leur structure cristalline ou par l'orientation particulière des plans cristallins comprenant des semi-conducteurs polycristallins
H01L 31/109 - Dispositifs sensibles au rayonnement infrarouge, visible ou ultraviolet caractérisés par une seule barrière de potentiel ou de surface la barrière de potentiel étant du type PN à hétérojonction
H01L 31/18 - Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives
27.
RADIATION DETECTOR AND PRODUCTION METHOD FOR RADIATION DETECTOR
A radiation detector includes: a sensor panel; a scintillator panel; and a resin frame provided across the sensor panel and the scintillator panel, in which the sensor panel has a mounting surface where the scintillator panel is mounted, the scintillator panel includes a support body having a first surface, a second surface on a side opposite to the first surface, and a first side surface connecting the first surface and the second surface to each other, and a scintillator layer formed on the first surface and containing a plurality of columnar crystals, the scintillator panel is mounted on the mounting surface such that the scintillator layer and the first surface face the mounting surface, and the scintillator layer has a second side surface extending so as to be positioned on the same plane as the first side surface.
This light modulation device comprises a light source, a control unit, and a spatial light modulator. The light source outputs a laser beam having strength corresponding to set strength. The spatial light modulator includes a plurality of pixel electrodes, a liquid crystal layer, a driving unit, and a cooling unit. The liquid crystal layer modulates a phase of the laser beam according to the size of an electric field formed by each of the plurality of pixel electrodes. The driving unit applies a voltage to the plurality of pixel electrodes. The cooling unit cools the liquid crystal layer such that the temperature of the liquid crystal layer approaches a set temperature. The control unit determines the set temperature of the cooling unit on the basis of the set strength of the laser beam.
G02F 1/133 - Dispositions relatives à la structure; Excitation de cellules à cristaux liquides; Dispositions relatives aux circuits
G02F 1/13 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p.ex. commutation, ouverture de porte ou modulation; Optique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur basés sur des cristaux liquides, p.ex. cellules d'affichage individuelles à cristaux liquides
Disclosed is a laser medium unit that includes a laser medium and a holding body. The laser medium has a pair of end surfaces. The holding body surrounds the laser medium when viewed form a direction intersecting with the pair of end surfaces and holds the laser medium. The holding body includes a deformation allowing portion that extends from the inside to the outside of the holding body when viewed from the direction intersecting with the pair of end surfaces. The laser medium and the holding body are in contact with each other. A contact region of the holding body with the laser medium has a width in the direction intersecting with the pair of end surfaces and extends along a side surface of the laser medium when viewed from the direction intersecting with the pair of end surfaces.
H01S 3/02 - Lasers, c. à d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet - Détails de structure
H01S 3/04 - Dispositions pour la gestion thermique
A scintillator panel includes: a first flexible support body having a first surface and a second surface on a side opposite to the first surface; a scintillator layer formed on the first surface and containing a plurality of columnar crystals; a second flexible support body provided on the second surface; an inorganic layer provided on the second flexible support body so as to be interposed between the second surface and the second flexible support body; and a first adhesive layer bonding the second surface and the inorganic layer to each other. A radiation detector includes: the scintillator panel; and a sensor panel including a photoelectric conversion element, in which the scintillator panel is provided on the sensor panel such that the first surface is on the sensor panel side with respect to the second surface.
The present embodiment relates to an electron multiplier or the like having a structure for realizing fast response characteristics as compared with the related art, and the electron multiplier includes at least a dynode unit, a stem, a coaxial cable, a conductive member, and a capacitor. The dynode unit includes multiple-stage dynodes, an anode, and a pair of insulating support members. An end portion of an outer conductor is drawn into the dynode unit together with an exposed portion of an inner conductor constituting a part of one end portion of the coaxial cable. With this configuration, it is possible to arrange the capacitor in a space between the dynode unit and the stem, and it is possible to fix the exposed portion of the inner conductor to a portion of the anode interposed between the pair of insulating support members.
A light emitting sealed body includes: a housing which stores a discharge gas and is provided with a first opening to which first light is incident along a first optical axis and a second opening from which second light is emitted along a second optical axis; a first window portion which hermetically seals the first opening; and a second window portion which hermetically seals the second opening. The housing is formed of a light shielding material which does not transmit the first light and the second light. An internal space is defined by the housing, the first window portion, and the second window portion and the internal space is filled with the discharge gas. The first opening and the second opening are disposed so that the first optical axis and the second optical axis intersect each other.
A method for manufacturing a mirror device, the method includes a first step of preparing a wafer having a support layer, a device layer, and an intermediate layer; a second step of forming a slit in the wafer such that the movable portion becomes movable with respect to the base portion by removing a part of each of the support layer, the device layer, and the intermediate layer from the wafer and forming a plurality of parts each corresponding to the structure in the wafer, after the first step; a third step of performing wet cleaning using a cleaning liquid after the second step; and a fourth step of cutting out each of the plurality of parts from the wafer after the third step. In the second step, a part of the intermediate layer is removed from the wafer by anisotropic etching.
B81C 1/00 - Fabrication ou traitement de dispositifs ou de systèmes dans ou sur un substrat
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
In a mirror unit, a first wall portion is higher than a second wall portion. A window member is disposed on a top surface of the first wall portion and a top surface of the second wall portion and is inclined with respect to a mirror surface. When any one of first to fourth wall portions is set as a first reference wall portion, in a cross-section perpendicular to the first reference wall portion, a first line passing through a first end at a side of the first reference wall portion in the mirror surface and a first corner portion formed at the side of the first reference wall portion by an outer surface and a first side surface in the window member intersects the first wall portion. A wiring portion includes a portion extending inside a base and leads outside a frame member.
METHOD FOR MEASURING LIGHT TRANSMISSION MEDIUM, DEVICE FOR MEASURING LIGHT TRANSMISSION MEDIUM, PROGRAM FOR MEASURING LIGHT TRANSMISSION MEDIUM, AND RECORDING MEDIUM
In a measurement method, light inputs with the same center wavelength and different properties are performed on a light transmission medium, and a measured value of an intensity spectrum of each of light outputs is acquired. An error between the measured value and an estimated value of the intensity spectrum calculated based on a theoretical relation between an intensity spectrum and a phase spectrum of each of the light inputs, a nonlinear coefficient and a wavelength dispersion value of the light transmission medium, and the intensity spectrum of each of the light outputs is calculated while changing the nonlinear coefficient and the wavelength dispersion value. Further, the nonlinear coefficient and the wavelength dispersion value are determined based on a difference, in a relation between the nonlinear coefficient and the wavelength dispersion value and the error, between the light inputs.
This laser processing device comprises a support unit for supporting a target object, a light source for emitting laser light, a spatial optical modulator for modulating the laser light by displaying a modulation pattern, a condensing unit for condensing the laser light onto the target object, a drive unit for driving at least one of the support unit and the condensing unit, and a control unit. The control unit causes the spatial optical modulator to display a modulation pattern that includes a trefoil aberration pattern such that a beam shape of the laser light at a focal spot includes a central portion and a first extended portion, a second extended portion and a third extended portion that extend in a radial pattern from the central portion, and such that the highest intensity in the beam shape central is in the central portion. The control unit causes the drive unit to drive the at least one of the support unit and the condensing unit such that the focal spot moves relatively along a line.
B23K 26/064 - Mise en forme du faisceau laser, p.ex. à l’aide de masques ou de foyers multiples au moyen d'éléments optiques, p.ex lentilles, miroirs ou prismes
B23K 26/073 - Détermination de la configuration du spot laser
B23K 26/53 - Travail par transmission du faisceau laser à travers ou dans la pièce à travailler pour modifier ou reformer le matériau dans la pièce à travailler, p.ex. pour faire des fissures d'amorce de rupture
H01L 21/301 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour subdiviser un corps semi-conducteur en parties distinctes, p.ex. cloisonnement en zones séparées
09 - Appareils et instruments scientifiques et électriques
Produits et services
Laser irradiation machines for metalworking; laser
irradiation machines for glass-working; laser irradiation
machines for stone-working; laser irradiation machines for
processing plastics; laser engraving machines; semiconductor
manufacturing machines; cutting machines for semiconductor
substrates; cutting machines for liquid crystal panels; 3D
printers. Optical modulators; optical apparatus and instruments,
namely, spatial light modulators; lasers, not for medical
purposes; computer software for controlling or managing
spatial light modulators; computer software for controlling
or managing laser irradiation machines; light dimmers;
measuring apparatus; measuring devices, electric; precision
measuring apparatus; testing apparatus not for medical
purposes; laboratory apparatus and instruments; apparatus
and instruments for physics; chemistry apparatus and
instruments.
38.
BIOLOGICAL SAMPLE HOLDING CONTAINER AND BIOLOGICAL SAMPLE HOLDING METHOD
A biological sample holding container includes: a container main body having a bottom surface portion having a placement region for a biological sample and a side surface portion provided on the bottom surface portion so as to surround the placement region; and an annular holding member insertable and removable inside the side surface portion. The holding member holds a film covering the biological sample on the placement region with the bottom surface portion by being inserted inside the side surface portion together with the film.
An analyzing unit of this spectrometry device uses a first correction factor to correct a first electrical signal such that a linearity characteristic of a first amplifier matches a reference linearity characteristic. The analyzing unit uses a second correction factor to correct a second electrical signal such that a linearity characteristic of a second amplifier matches the reference linearity characteristic. The analyzing unit generates first spectrum data on the basis of the corrected first electrical signal, and generates second spectrum data on the basis of the corrected second electrical signal. The analyzing unit generates spectrum data of light to be measured, on the basis of the first spectrum data and the second spectrum data.
This semiconductor light emitting device comprises: a plurality of iPM lasers that each have a first surface and a second surface opposite the first surface, and that output light from the first surface; and a drive circuit that supplies a drive current for causing each of the plurality of iPM lasers to emit light. The drive circuit includes: a common current source circuit for the plurality of iPM lasers; a plurality of switch portions respectively provided to correspond to the plurality of iPM lasers to switch on/off of the drive current; and a switch operation portion that causes each of the plurality of switch portions to operate separately.
H01S 5/026 - Composants intégrés monolithiques, p.ex. guides d'ondes, photodétecteurs de surveillance ou dispositifs d'attaque
H01S 5/185 - Lasers à émission de surface [lasers SE], p.ex. comportant à la fois des cavités horizontales et verticales comportant uniquement des cavités horizontales, p.ex. lasers à émission de surface à cavité horizontale [HCSEL]
H01S 5/42 - Réseaux de lasers à émission de surface
41.
LASER PROCESSING APPARATUS AND LASER PROCESSING METHOD
A laser processing apparatus includes a support unit that supports a wafer including a plurality of functional elements disposed adjacent to each other via a street, an irradiation unit that irradiates the street with laser light, and a control unit that controls the irradiation unit based on information about the streets so that a first region and a second region of the street are simultaneously irradiated with the laser light, and a power of the laser light for removing a surface layer of the street in the first region is higher than a power for removing the surface layer of the street in the first region. The information about the street includes information that a processing threshold value indicating a difficulty of laser processing in the first region is lower than a processing threshold value in the second region.
B23K 26/53 - Travail par transmission du faisceau laser à travers ou dans la pièce à travailler pour modifier ou reformer le matériau dans la pièce à travailler, p.ex. pour faire des fissures d'amorce de rupture
B23K 26/03 - Observation, p.ex. surveillance de la pièce à travailler
B23K 26/364 - Gravure au laser pour faire une rainure ou une saignée, p.ex. pour tracer une rainure d'amorce de rupture
H01L 21/268 - Bombardement par des radiations ondulatoires ou corpusculaires par des radiations d'énergie élevée les radiations étant électromagnétiques, p.ex. des rayons laser
An output window unit which comprises a window foil that allows an electron beam to pass therethrough toward the outside of a housing and a support member fixed to the housing and supporting the window foil, wherein the support member comprises: a mesh-shaped portion facing the window foil and having a plurality of through-holes through which the electron beam from an electron source passes toward the window foil; a solid frame portion integrally formed with the mesh-shaped portion so as to surround the mesh-shaped portion when viewed from a first direction, which is the facing direction of the window foil and the mesh-shaped portion; and an outer portion which is located outside both the mesh-shaped portion and the frame portion when viewed from the first direction and which has been integrally formed with the mesh-shaped portion and the frame portion. The support member has a recess formed therein so as to extend along the first direction.
A spectroscopic measurement apparatus includes an optical system, a photodetector, and an analysis unit. The optical system guides measurement target light from an object to a light receiving surface of the photodetector, and forms a spectral image of the measurement target light on the light receiving. The photodetector includes the light receiving surface on which a plurality of pixels are arranged respectively on a plurality of rows. The photodetector receives the spectral image for a first exposure time by a plurality of pixels in a first region on the light receiving surface, and outputs first spectrum data. The photodetector receives the spectral image for a second exposure time by a plurality of pixels in a second region on the light receiving surface, and outputs second spectrum data. The second exposure time is longer than the first exposure time.
G01J 3/32 - Mesure de l'intensité des raies spectrales directement sur le spectre lui-même en étudiant des bandes d'un spectre successivement à l'aide d'un détecteur unique
44.
LIGHT IRRADIATION APPARATUS, MEASURING APPARATUS, OBSERVATION APPARATUS, AND FILM THICKNESS MEASURING APPARATUS
This light irradiation apparatus comprises: a light source which emits light; a light pipe which receives light emitted from the light source and which uniformizes illuminance distribution of said light and outputs the resulting light; a diffuser plate which diffuses light outputted from the light pipe; and a light pipe which receives light diffused by the diffuser plate and which uniformizes illuminance distribution of said light and outputs the resulting light. In other words, the light irradiation apparatus comprises two light pipes and a diffuser plate interposed between said two light pipes.
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
45.
LIGHT IRRADIATION DEVICE, MEASUREMENT DEVICE, OBSERVATION DEVICE, AND FILM THICKNESS MEASUREMENT DEVICE
This light irradiation device comprises: a light source which emits light; a light pipe into which light emitted from the light source enters and which uniformizes the luminance distribution of the light and outputs the light; a diffusing part which diffuses the light output from the light pipe; and a light pipe into which the light diffused by the diffusion part enters and which uniformizes the luminance distribution of the light and outputs the light, wherein the diffusing part is a light diffusing surface provided on a light output surface of the light pipe.
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
46.
IMAGE ACQUISITION DEVICE AND IMAGE ACQUISITION METHOD
An image acquisition device 1A comprises a measurement unit 10 and a processing unit 20. For each coincidence counting event in which a first detector 11 and a second detector 12 have performed coincidence counting of a pair of gamma-ray photons generated by a pair annihilation event of electrons and positrons at a positron emission nuclide 81, the processing unit 20 determines a position at which gamma-ray photons exhibited Compton scattering in a subject 90 on the basis of detection positions and detection times of the gamma-ray photons detected by the first detector 11 and the second detector 12 as well as the position of the positron emission nuclide 81 on the assumption that gamma-ray photons arrived at one of the first detector 11 or the second detector 12 without exhibiting Compton scattering in the subject 90 and that gamma-ray photons arrived at the other after exhibiting Compton scattering in the subject 90. As a result, an image acquisition device and an image acquisition method are achieved, said device and method being capable of acquiring a tomographic image representing anatomical information pertaining to the subject without performing image reconstruction processing.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Recorded application software for use in micro LED inspection apparatus; recorded application software for use in LED inspection apparatus; recorded application software for use in semiconductor wafer inspection apparatus; recorded application software for use in semiconductor inspection apparatus; recorded application software for use in apparatus for testing products, namely, inspection apparatus for finding defects of products; recorded application software for use in optical inspection apparatus.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Application software used in Micro LED inspection apparatus; application software used in LED inspection apparatus; application software used in semiconductor wafer inspection apparatus; application software used in semiconductor inspection apparatus; application software used in measuring apparatus; application software used in optical apparatus and instruments; application software used in telecommunications apparatus and instruments; application software used in laboratory instruments [other than for medical use]; application software; computer software; computer software programs; Micro LED inspection apparatus; semiconductor inspection apparatus; microscope; optical apparatus and instruments; detectors; measuring apparatus; semi-conductors; integrated circuits; silicon epitaxial wafer; wafers for integrated circuits; electronic chips; light emitting diodes (LEDs); displays and screens made of micro LEDs.
A radiation imaging device according to one embodiment comprises a radiation detection panel, a base substrate having a support surface configured to support the radiation detection panel, and a housing, wherein: the housing has a top wall and a bottom wall, the base substrate has a protruding portion which protrudes further outward than the radiation detection panel when seen in a direction orthogonal to the support surface, a first extending portion is provided to the support surface of the protruding portion, a second extending portion is provided to a back surface of the protruding portion, the second extending portion being disposed at a position which it faces the first extending portion with the protruding portion interposed therebetween, and the base substrate is supported on the top wall via the first extending portion and is supported on the bottom wall via the second extending portion.
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p.ex. sur la position ou la section du faisceau; Mesure de la distribution spatiale de radiations
A distance measurement device 1 comprises a light source 2, a light reception unit 5, a control unit 6 and a processing unit 7. The light reception unit 5 includes a photodiode and a charge storage unit that stores a charge which has been generated in the photodiode. The control unit 6 provides, to the light reception unit 5, a control pattern including M frames which instruct whether or not to store the charge in the charge storage unit in each of N periods that are divided with a fixed time T, from the light pulse output timing of the light source 2. When the control pattern is represented by a matrix of M rows and N columns, and the value of an element in the m-th row and the n-th column of this matrix is set to 1 at the time when charge storage is instructed in the n-th period in the m-th frame and the value is set to 0 at the time when non-storage is instructed, all combinations of adjacent two column vectors among N column vectors constituting the matrix satisfy a condition such as the condition that the Hamming distance therebetween is 1. This achieves a device that can reliably carry out distance measurement by the TOF method using a compressed sensing technique.
A concentrating lens includes an incident surface, an emitting surface, and a reflective surface. The incident surface includes a central portion and an outer portion. The incident surface is formed by an inner surface of a depression portion. The reflective surface surrounds the emitting surface. The reflective surface extends so as to go toward a first side as going toward an outside. A first light incident on the outer portion of the incident surface transmits through the outer portion, is reflected by the reflective surface, reflected by the incident surface, and incident on the emitting surface. A second light incident on the central portion of the incident surface transmits through the central portion and is incident on the emitting surface. The central portion of the incident surface reflects the first light reflected by the reflective surface, toward the emitting surface and transmits the second light.
The spectrometer includes: a light source unit emitting a laser beam; a mirror unit including a first plane mirror having a first mirror surface and a second plane mirror having a second mirror surface, wherein a measurement target is introduced between the first mirror surface and the second mirror surface; and a light detector detecting the laser beam returned by multiple reflection between the first mirror surface and the second mirror surface. The first mirror surface and the second mirror surface are arranged non-parallel to each other when viewed from the Z-axis direction so as to form an optical path of the laser beam reciprocating in the Y-axis direction while performing multiple reflection between the first mirror surface and the second mirror surface. The optical path of the laser beam between the first mirror surface and the second mirror surface is inclined with respect to the Z-axis direction.
An active energy irradiation device includes: a plurality of active energy irradiation units; a housing that houses the active energy irradiation units; an exhaust unit that is provided in the housing, and that discharges air to an outside of the housing; and an inert gas suction unit that suctions an inert gas outside the housing, and that allows the inert gas to flow into the housing, wherein an air flow path allowing the air to flow through, and an inert gas flow path allowing the inert gas to flow through are provided inside the housing, the air flow path and the inert gas flow path merge with each other, and the exhaust unit exhausts the inert gas together with the air.
An intra-oral imaging system includes an imaging device and a control device. The imaging device includes an imager, a controller, and a case in which the imager and the controller are housed. The imager performs imaging detection for detecting radiation in order to acquire an image of an object and monitoring detection for detecting radiation in order to monitor the dose of radiation. The controller transmits an imaging signal and a monitoring signal to the control device, the imaging signal acquired by the imaging detection and the monitoring signal acquired by the monitoring detection. The control device receives the imaging signal and the monitoring signal, and transmits a control command to the controller, the control command generated based on the monitoring signal. The controller controls the imager according to the control command.
The present invention relates to a method for assessing mitochondrial function in a tissue or organ other than the kidney in a test subject, including: a step of calculating a ratio (BUN/CRE) of blood urea nitrogen (BUN) concentration to blood creatinine (CRE) concentration in a test subject; and a step of estimating mitochondrial activity in a tissue or organ other than the kidney in the test subject using the calculated ratio (BUN/CRE).
G01N 33/70 - Analyse chimique de matériau biologique, p.ex. de sang ou d'urine; Test par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligands; Test immunologique faisant intervenir la créatine ou la créatinine
G01N 33/62 - Analyse chimique de matériau biologique, p.ex. de sang ou d'urine; Test par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligands; Test immunologique faisant intervenir l'urée
56.
LIGHT-EMITTING ELEMENT, OPTICAL DETECTION MODULE, MANUFACTURING METHOD FOR LIGHT-EMITTING ELEMENT, AND SCANNING ELECTRON MICROSCOPE
There are provided a light-emitting element, an optical detection module, a method for manufacturing a light-emitting element, and a scanning electron microscope using the same, by which it is possible to reduce crosstalk and expand the range of applications. A light-emitting element includes a fiber optic plate substrate having transparency to fluorescence and a light-emitting layer as a nitride semiconductor layer having a quantum well structure. In the light-emitting element, the fiber optic plate substrate and the light-emitting layer are directly bonded to each other.
H01L 33/12 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails caractérisés par les corps semi-conducteurs ayant une structure de relaxation des contraintes, p.ex. couche tampon
H01L 33/60 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails caractérisés par les éléments du boîtier des corps semi-conducteurs Éléments de mise en forme du champ optique Éléments réfléchissants
H01L 33/06 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails caractérisés par les corps semi-conducteurs ayant une structure à effet quantique ou un superréseau, p.ex. jonction tunnel au sein de la région électroluminescente, p.ex. structure de confinement quantique ou barrière tunnel
H01L 33/32 - Matériaux de la région électroluminescente contenant uniquement des éléments du groupe III et du groupe V de la classification périodique contenant de l'azote
An intra-oral imaging device includes: an imager that detects radiation transmitted through an object while being placed in an oral cavity; and a controller that controls the imager while being placed outside the oral cavity. The imager includes an image sensor including a plurality of pixels for acquiring an image of the object. While power is being supplied to the controller, the controller supplies power to the image sensor in an imaging period during which the image sensor performs imaging and stops supplying the power to the image sensor in a standby period during which the image sensor is on standby.
A method for manufacturing a mirror device, the method includes a first step of preparing a wafer having a support layer and a device layer; a second step of forming a slit in the wafer such that the movable portion becomes movable with respect to the base portion by removing a part of each of the support layer and the device layer from the wafer by etching and forming a plurality of parts each corresponding to the structure in the wafer, after the first step; a third step of performing wet cleaning for cleaning the wafer using a cleaning liquid after the second step; and a fourth step of cutting out each of the plurality of parts from the wafer after the third step. In the second step, a circulation hole penetrating the wafer is formed at a part other than the slit in the wafer by the etching.
B81C 1/00 - Fabrication ou traitement de dispositifs ou de systèmes dans ou sur un substrat
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
09 - Appareils et instruments scientifiques et électriques
Produits et services
Accessories for mass spectrometers, namely,
ionization-assisting substrates for mass spectrometry;
transfer plates with porous medium for sample pretreatment
for mass spectrometry (accessories for mass spectrometers);
mass spectrometers, and their parts, accessories and
fittings; measuring or testing machines and instruments;
laboratory apparatus and instruments; optical machines and
apparatus.
The ion sensor includes a substrate and a plurality of detection units. Each detection unit includes an ID portion, an ICG electrode, a TG electrode, an SG electrode, an electrode pad, and an ion sensitive film. The SG electrode is disposed between the ICG electrode and the TG electrode on the main surface of the substrate. The electrode pad is electrically connected to the SG electrode and disposed on the opposite side of the SG electrode from the substrate. The ion sensitive film is provided on the surface of the electrode pad, and changes a potential according to change in ion concentration of the aqueous solution in contact with the ion sensitive film. A width of the ion sensitive film in a facing direction in which the ICG electrode and the TG electrode face each other is greater than a separation width between the ICG electrode and the TG electrode.
An active energy irradiation device includes: an active energy irradiation unit having an emitting surface extending in both a first direction and a second direction, the emitting surface configured to emit an active energy ray to one side in a third direction; an inert gas supply unit having a spray port located on one side in the second direction with respect to the emitting surface, the spray port configured to spray an inert gas to the one side in the third direction; and a structure including a protrusion portion located on the other side in the second direction with respect to the emitting surface, the protrusion portion protruding to the one side in the third direction with respect to the emitting surface. A width in the second direction of the protrusion portion is larger than a width in the third direction of the protrusion portion.
B01J 19/12 - Procédés utilisant l'application directe de l'énergie ondulatoire ou électrique, ou un rayonnement particulaire; Appareils à cet usage utilisant des radiations électromagnétiques
A shape measurement apparatus includes a light source, an irradiation optical system, an imaging optical system, a spatial light modulator, a focusing optical system, a linear sensor, and a processing unit. The irradiation optical system forms the light into a line shape and irradiates an object. The imaging optical system forms an image of the light reflected by the object. The spatial light modulator, in which a one-dimensional intensity modulation pattern is set on a light modulation plane, spatially intensity-modulates and outputs the light. The focusing optical system focuses the light output from the spatial light modulator in a line shape. The linear sensor receives the light focused in the line shape by pixels. The processing unit performs analysis by the compressive sensing technique for each of the pixels based on the intensity modulation pattern and an output signal from the linear sensor.
A control device 20 includes an image acquisition unit 203 configured to acquire a radiographic image obtained by irradiating a subject F with radiation and capturing an image of the radiation passing through the subject F, a noise map generation unit 204 configured to derive an evaluation value obtained by evaluating spread of a noise value from a pixel value of each pixel in the radiographic image on the basis of relationship data indicating a relationship between the pixel value and the evaluation value and generate a noise map that is data in which the derived evaluation value is associated with each pixel in the radiographic image, and a processing unit 205 configured to input the radiographic image and the noise map to a trained model 207 constructed in advance through machine learning and execute image processing of removing noise from the radiographic image.
A solid-state imaging device includes a pixel array unit, a row control unit, a row readout unit, a column control unit, and a column readout unit. The pixel array unit includes MN pixels each including a photodiode for generating charges by receiving light and arrayed two-dimensionally in M rows and N columns. The pixel inputs an m-th row control signal output from the row control unit to an m-th row control line, inputs an n-th column control signal output from the column control unit to an n-th column control line, and selects whether the charges generated in the photodiode are output to an m-th row output line or an n-th column output line based on a logical value of each of the m-th row control signal and the n-th column control signal.
H04N 25/78 - Circuits de lecture pour capteurs adressés, p. ex. amplificateurs de sortie ou convertisseurs A/N
H04N 25/766 - Capteurs adressés, p.ex. capteurs MOS ou CMOS comprenant des lignes de commande ou de sortie utilisées pour une pluralité de fonctions, p. ex. pour la sortie, la commande, la réinitialisation ou l'alimentation des pixels
67.
PEPTIDE LINKER AND LOCALIZATION METHOD FOR LOCALIZING TRANSMEMBRANE PROTEIN TO TARGET ORGANELLE, AND LOCALIZING FUSION PROTEIN
Disclosed are a highly rigid peptide linker inserted between a transmembrane protein and an organelle transport signal, a fusion protein containing the same, and a localization method that includes inserting a peptide linker.
A61K 38/17 - Peptides ayant plus de 20 amino-acides; Gastrines; Somatostatines; Mélanotropines; Leurs dérivés provenant d'humains
A61K 48/00 - Préparations médicinales contenant du matériel génétique qui est introduit dans des cellules du corps vivant pour traiter des maladies génétiques; Thérapie génique
A61P 43/00 - Médicaments pour des utilisations spécifiques, non prévus dans les groupes
C07K 2/00 - Peptides à nombre indéterminé d'amino-acides; Leurs dérivés
C12N 15/63 - Introduction de matériel génétique étranger utilisant des vecteurs; Vecteurs; Utilisation d'hôtes pour ceux-ci; Régulation de l'expression
68.
LASER PROCESSING DEVICE AND LASER PROCESSING METHOD
A laser processing method includes: a first step of preparing a wafer including a plurality of functional elements disposed to be adjacent to each other via a street; and a second step of, after the first step, irradiating the street with laser light based on information regarding the street such that a surface layer of the street is removed in a first region of the street and the surface layer remains in a second region of the street. The information regarding the street includes information indicating that, when a modified region is formed in the wafer along a line passing through the street, a fracture extending from the modified region does not reach the street along the line in the first region, and reaches the street along the line in the second region.
B23K 26/351 - Travail par rayon laser, p.ex. soudage, découpage ou perçage pour l'ajustage ou l'accord de composants électriques
B23K 26/064 - Mise en forme du faisceau laser, p.ex. à l’aide de masques ou de foyers multiples au moyen d'éléments optiques, p.ex lentilles, miroirs ou prismes
B23K 26/04 - Alignement, pointage ou focalisation automatique du faisceau laser, p.ex. en utilisant la lumière rétrodiffusée
69.
ACTIVE ENERGY IRRADIATION DEVICE AND ACTIVE ENERGY IRRADIATION SYSTEM
An active energy irradiation device includes: an active energy irradiation unit having an emitting surface configured to emit an active energy ray; and an inert gas supply unit having a spray port configured to spray an inert gas. The inert gas supply unit includes a housing provided with the spray port, a connection portion provided to the housing, and a throttle portion provided to the connection portion. A pipe for supplying the inert gas into the housing is connectable to the connection portion.
B01J 19/12 - Procédés utilisant l'application directe de l'énergie ondulatoire ou électrique, ou un rayonnement particulaire; Appareils à cet usage utilisant des radiations électromagnétiques
A61N 5/10 - Radiothérapie; Traitement aux rayons gamma; Traitement par irradiation de particules
70.
ORGANIC LIGHT RECEIVING ELEMENT AND LIGHT RECEIVING DEVICE
KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION (Japon)
HAMAMATSU PHOTONICS K.K. (Japon)
Inventeur(s)
Adachi, Chihaya
Nakanotani, Hajime
Yamanaka, Takahiko
Hara, Shigeo
Abrégé
An organic light-receiving element includes an organic light-receiving layer containing a plurality of organic semiconductor molecules. Each of the plurality of organic semiconductor molecules is a molecule in which an excited state enabling reverse intersystem crossing from a lowest excited triplet state to a lowest excited singlet state is formed in each of the plurality of organic semiconductor molecules due to irradiation with light.
H10K 30/20 - Dispositifs organiques sensibles au rayonnement infrarouge, à la lumière, au rayonnement électromagnétique de plus courte longueur d'onde ou au rayonnement corpusculaire comprenant des jonctions organiques-organiques, p. ex. des jonctions donneur-accepteur
A mirror unit includes an optical scanning device, a frame member, and a window member. The frame member includes first and second wall portions facing each other in an X-axis direction. The first wall portion is higher than the second wall portion. The window member is disposed on a top surface of the first wall portion and a top surface of the second wall portion and is inclined with respect to a mirror surface of the optical scanning device. In a cross-section parallel to the X-axis direction, the first wall portion is separated from a first line passing through a first end at a side of the first wall portion in the mirror surface and a first corner portion formed at the side of the first wall portion by an outer surface opposite to the frame member and a first side surface in the window member.
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
72.
LASER PROCESSING DEVICE AND LASER PROCESSING METHOD
This laser processing device comprises: a support unit that supports a wafer; a light source; a spatial optical modulator; a light collecting unit; a moving unit that moves the light collecting unit in an optical axis direction perpendicular to the surface thereof, relative to the surface; a visible image capturing unit that acquires a captured image by detecting light that has propagated in the wafer through the light collecting unit; and a control unit. The control unit is configured to perform: a first process for controlling the moving unit; a second process for controlling a light source 3 so as to emit laser light continuously; a third process for controlling the visible image capturing unit so that the light reflected on the back surface of the wafer can be detected to acquire a plurality of captured images continuously; and a fourth process for composing the plurality of captured images to thereby acquire an optical axis profile which is a profile image of the laser light along the optical axis direction.
H01L 21/301 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour subdiviser un corps semi-conducteur en parties distinctes, p.ex. cloisonnement en zones séparées
B23K 26/00 - Travail par rayon laser, p.ex. soudage, découpage ou perçage
B23K 26/064 - Mise en forme du faisceau laser, p.ex. à l’aide de masques ou de foyers multiples au moyen d'éléments optiques, p.ex lentilles, miroirs ou prismes
This light detection device comprises: a package having an opening; a light transmission section that blocks the opening and has a light-emitting surface located inside the package; a Fabry-Perot interference filter that includes a pair of mirror sections, the distance between the mirror sections being variable; a light detector; and a first aperture section having a first aperture located, inside the package, between the light-emission surface and the Fabry-Perot interference filter. The first aperture section includes a first surrounding part that surrounds the first aperture. The Fabry-Perot interference filter-side surface of the first surrounding part is separated from the Fabry-Perot interference filter, and absorbs light.
G01J 3/26 - Production du spectre; Monochromateurs en utilisant une réflexion multiple, p.ex. interféromètre de Fabry-Perot, filtre à interférences variables
G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives
74.
RADIATION DETECTOR, RADIATION DETECTOR MANUFACTURING METHOD, AND SCINTILLATOR PANEL UNIT
A radiation detector includes a sensor panel having a light receiving surface, and a first scintillator panel and a second scintillator panel disposed on the light receiving surface in a state of being adjacent to each other along the light receiving surface. The first scintillator panel has a first substrate and a first scintillator layer including a plurality of columnar crystals. The second scintillator panel has a second substrate and a second scintillator layer including a plurality of columnar crystals. The first scintillator layer reaches at least a first portion of the first substrate. The second scintillator layer reaches at least a second portion of the second substrate. A first angle in the first scintillator panel is 90 degrees or less. A second angle in the second scintillator panel is 90 degrees or less.
A spectroscopic module includes a plurality of beam splitters that are arranged along an X direction; a plurality of bandpass filters disposed on one side in a Z direction with respect to the plurality of beam splitters facing the plurality of beam splitters, respectively; a light detector disposed on the one side in the Z direction with respect to the plurality of bandpass filters and including a plurality of light receiving regions facing the plurality of bandpass filters, respectively; a first support body supporting the plurality of beam splitters; and a second support body supporting the plurality of bandpass filters. The second support body includes a support portion in which a support surface is formed so as to be open to the one side in the Z direction. The plurality of bandpass filters are disposed on the support surface.
An actuator device manufacturing method includes: a preparation step of preparing an actuator device including a support portion, a movable portion, a connection portion, and a metal member disposed such that a stress acts on the metal member when the movable portion oscillates; an oscillation step of oscillating the movable portion for a predetermined time; an acquisition step of acquiring a parameter related to a viscous resistance in a vibration of the movable portion; and a determination step of determining that the actuator device is qualified, when a difference between the parameter acquired in the acquisition step and a reference value corresponding to the parameter at a start of the oscillation step is a predetermined value or more in a direction in which the viscous resistance decreases, and determining that the actuator device is disqualified, when the difference is less than the predetermined value.
H02K 1/34 - Parties du circuit magnétique à mouvement alternatif, oscillant ou vibrant
H02K 33/02 - Moteurs avec un aimant, un induit ou un système de bobines à mouvement alternatif, oscillant ou vibrant avec des induits entraînés dans un sens par application d'énergie à un système à une seule bobine et ramenés par une force d'origine mécanique, p.ex. par des ressorts
H02N 2/00 - Machines électriques en général utilisant l'effet piézo-électrique, l'électrostriction ou la magnétostriction
77.
METHOD FOR DETERMINING REGION OF CELL THAT HAS UNDERGONE PROGRAMMED CELL DEATH, DEVICE COMPRISING DETERMINATION UNIT, AND INFORMATION PROCESSING PROGRAM INCLUDING DETERMINATION STEP
Disclosed are a method, a device, and an information processing program for determining, by using refractive index distribution data pertaining to an object to be observed, the region of a cell that has undergone programmed cell death in the object to be observed.
C12Q 1/02 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismes; Compositions à cet effet; Procédés pour préparer ces compositions faisant intervenir des micro-organismes viables
C12M 1/00 - Appareillage pour l'enzymologie ou la microbiologie
C12M 1/34 - Mesure ou test par des moyens de mesure ou de détection des conditions du milieu, p.ex. par des compteurs de colonies
G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
G01N 21/45 - Réfringence; Propriétés liées à la phase, p.ex. longueur du chemin optique en utilisant les méthodes de Schlieren
G01N 33/50 - Analyse chimique de matériau biologique, p.ex. de sang ou d'urine; Test par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligands; Test immunologique
78.
METHOD, DEVICE, AND INFORMATION PROCESSING PROGRAM FOR DETERMINING NECROSIS CELL REGION
Disclosed are a method, device, and information processing program for determining a necrosis cell region in an object to be observed, using refractive-index distribution data pertaining to the object to be observed.
C12Q 1/04 - Détermination de la présence ou du type de micro-organisme; Emploi de milieux sélectifs pour tester des antibiotiques ou des bactéricides; Compositions à cet effet contenant un indicateur chimique
G01N 21/45 - Réfringence; Propriétés liées à la phase, p.ex. longueur du chemin optique en utilisant les méthodes de Schlieren
C12M 1/34 - Mesure ou test par des moyens de mesure ou de détection des conditions du milieu, p.ex. par des compteurs de colonies
An attenuator device includes: a first window pair that includes a pair of first windows having a pair of first surfaces extending to form a Brewster's angle with an optical axis; a rotation holding portion which holds the first window pair to be rotatable around the optical axis; a second window pair that includes a pair of second windows having a pair of second surfaces extending to form a Brewster's angle with the optical axis; and a λ/4 phase element which gives a phase difference of λ/4 between a polarized component parallel to an optical axis and a polarized component orthogonal to the optical axis when a wavelength of laser light is λ. The second window pair is disposed so that a vibration direction of a P-polarized component transmitted through the second window pair is inclined with respect to the optical axis of the λ/4 phase element by 45° when viewed from a direction parallel to the optical axis.
A laser processing method includes a first step of preparing a wafer including a plurality of functional elements disposed to be adjacent to each other via a street, a second step of, after the first step, forming a modified region in the wafer along a line passing through the street, and a third step of, after the second step, irradiating the street with laser light such that a surface layer of the street is removed, and a fracture extending from the modified region reaches a bottom surface of a recess formed by removing the surface layer, along the line.
B23K 26/38 - Enlèvement de matière par perçage ou découpage
B23K 37/00 - Dispositifs ou procédés auxiliaires non spécialement adaptés à un procédé couvert par un seul des autres groupes principaux de la présente sous-classe
82.
ACTIVE ENERGY IRRADIATION DEVICE AND ACTIVE ENERGY IRRADIATION SYSTEM
An active energy irradiation device includes: a plurality of active energy irradiation units; an air-cooled heatsink thermally connected to the active energy irradiation units; a housing that houses the active energy irradiation units and the heatsink; an intake unit that introduces air into the housing; an exhaust unit that discharges the air to an outside of the housing; and a duct provided between the heatsink and the exhaust unit inside the housing, and allowing the air, which has passed through the heatsink, to flow through to the exhaust unit. An air presence region where the air exists before passing through the heatsink is provided around the duct inside the housing so as to surround the duct.
A spectroscopic unit includes a housing having a wall part formed with an opening, a first aperture part formed with a first aperture, and a second aperture part formed with a second aperture, in which a length of the second aperture in the facing direction is larger than a length of the first aperture in the facing direction, an outer edge of the first aperture is positioned inside each of an outer edge of the opening and an outer edge of the second aperture, and the first aperture includes at least one of a first tapered portion reaching a first surface of the first aperture part and extending toward the first surface, and a second tapered portion reaching a second surface of the first aperture part and extending toward the second surface.
G01J 3/26 - Production du spectre; Monochromateurs en utilisant une réflexion multiple, p.ex. interféromètre de Fabry-Perot, filtre à interférences variables
G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives
84.
METHOD, DEVICE, AND PROGRAM FOR IDENTIFYING OR EVALUATING BILE CANALICULUS REGIONS
Disclosed are: a method for identifying, by using refractive index distribution data of an observation object containing liver cells, bile canaliculus regions included in the observation object; and a method for evaluating the bile canaliculus regions on the basis of bile canaliculus parameters obtained from the refractive index distribution data of the observation object containing the liver cells.
G01N 21/41 - Réfringence; Propriétés liées à la phase, p.ex. longueur du chemin optique
C12M 1/00 - Appareillage pour l'enzymologie ou la microbiologie
C12M 3/00 - Appareillage pour la culture de tissus, de cellules humaines, animales ou végétales, ou de virus
C12Q 1/02 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismes; Compositions à cet effet; Procédés pour préparer ces compositions faisant intervenir des micro-organismes viables
G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
This semiconductor laser device comprises: a semiconductor laser element having a plurality of mesa sections; and a submount having recesses in which the plurality of mesa sections are disposed. The recesses each have a wiring section provided therein. An electrode corresponding to each mesa section is electrically connected to the wiring section via a solder member. The wiring section includes first wiring and second wiring that are mutually adjacent and mutually electrically isolated. A first reference surface of the semiconductor laser element is in planar contact with a second reference surface of the submount. The distance from a first base section of a first mesa section corresponding to the first wiring to a second base section of a second mesa section corresponding to the second wiring is greater than the length of a contact region of the mesa sections.
The present invention provides a semiconductor laser device comprising: a semiconductor laser element including a plurality of mesa portions; and a submount including a plurality of recesses where the plurality of mesa portions are arranged. An electrode corresponding to each of the plurality of mesa portions is electrically connected to a wiring section via a solder member. A first reference surface of the semiconductor laser element is in surface-contact with a second reference surface of the submount. A wall section including the second reference surface is provided between adjacent recesses. When viewed in the Y-axis direction, the distance in the X-axis direction between a side surface of the recess and an opposing side surface of the mesa portion decreases along the Z axis direction from the top surface to the base end of the mesa portion.
Disclosed is a laser device including: a laser light source configured to emit laser light; a phase control unit configured to receive the laser light emitted from the laser light source, to control a spatial phase of a portion of the laser light, to emit the portion of the light as control light, and to emit another portion of the laser light as non-control light; a first optical system configured to irradiate an object with the control light emitted from the phase control unit; a detector configured to detect the non-control light emitted from the phase control unit; a second optical system configured to cause the non-control light emitted from the phase control unit to converge toward a detection surface of the detector.
H01S 3/00 - Lasers, c. à d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
B23K 26/064 - Mise en forme du faisceau laser, p.ex. à l’aide de masques ou de foyers multiples au moyen d'éléments optiques, p.ex lentilles, miroirs ou prismes
G02F 1/01 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p.ex. commutation, ouverture de porte ou modulation; Optique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur
G02F 1/133 - Dispositions relatives à la structure; Excitation de cellules à cristaux liquides; Dispositions relatives aux circuits
G02F 1/137 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p.ex. commutation, ouverture de porte ou modulation; Optique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur basés sur des cristaux liquides, p.ex. cellules d'affichage individuelles à cristaux liquides caractérisés par l'effet électro-optique ou magnéto-optique, p.ex. transition de phase induite par un champ, effet d'orientation, interaction entre milieu récepteur et matière additive ou diffusion dynamique
88.
LIGHT DETECTOR, RADIATION DETECTOR, AND PET DEVICE
A light detector includes a semiconductor light detection element having a plurality of light detection units disposed two-dimensionally and readout wirings and a plurality of metalenses disposed on a surface of the semiconductor light detection element. Each of the plurality of light detection units has an avalanche photodiode including a first semiconductor region and a second semiconductor region forming a PN junction with the first semiconductor region, and a quenching resistor including one end electrically connected to the second semiconductor region and another end electrically connected to the readout wiring. The plurality of metalenses are disposed two-dimensionally to overlap the plurality of light detection units, and converge light such that a convergence spot is located at a position which is within the first semiconductor region and which is separated by a predetermined distance from a boundary between the first semiconductor region and the second semiconductor region.
G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p.ex. sur la position ou la section du faisceau; Mesure de la distribution spatiale de radiations
A transfer part of a photoelectric conversion device includes a first transfer region configured to transfer electric charge along a first line, a second transfer region configured to transfer the electric charge along a second line, a third transfer region configured to transfer the electric charge along a third line, a first transfer electrode, and a second transfer electrode. The third line is deviated from at least one of the first line and the second line. The third transfer region includes a first semiconductor region having a first impurity concentration, and a second semiconductor region having a second impurity concentration higher than the first impurity concentration. The second semiconductor region extends along the third line to be widened on the second transfer region side. The first semiconductor region is disposed on both sides of the second semiconductor region.
An optical module includes: a mirror unit; and a magnet unit including first, second, and third magnets arranged along a first direction. The mirror unit is disposed on the magnet unit in a second direction perpendicular to the first direction. A width of the first magnet is equal to or more than widths of the second and third magnets. An upper surface of the first magnet is located on a mirror unit side with respect to upper surfaces of the second and third magnets in the second direction, or is located at the same position as one of the upper surfaces of the second and third magnets and on the mirror unit side with respect to the other of the upper surfaces of the second and third magnets in the second direction. The mirror unit is fixed to at least the upper surface of the first magnet.
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
The light detector includes: a substrate including at least one light receiving area and a light incident surface on which light is incident; and a meta-lens formed on the light incident surface of the substrate to focus the light incident on the light incident surface. When viewed from the thickness direction (Z-axis direction) of the substrate, the meta-lens is formed so as to overlap both an adjacent region adjacent to the light receiving area and a peripheral region that is continuous with the adjacent region and is a region inside the light receiving area along the outer edge of the light receiving area. When viewed from the Z-axis direction, a non-forming region in which the meta-lens is not formed is provided in a region overlapping a central region of the light receiving area in the light incident surface.
H01L 31/0232 - Dispositifs à semi-conducteurs sensibles aux rayons infrarouges, à la lumière, au rayonnement électromagnétique d'ondes plus courtes, ou au rayonnement corpusculaire, et spécialement adaptés, soit comme convertisseurs de l'énergie dudit rayonnement e; Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives; Leurs détails - Détails Éléments ou dispositions optiques associés au dispositif
In a semiconductor laser device, a supply path that guides a cooling fluid supplied from a supply port side, toward a disposition region, spray holes that spray the cooling fluid guided by the supply path, from below the disposition region, and a discharge path that guides the cooling fluid sprayed from the spray holes, toward a discharge port are provided within a body portion of a heat sink. The spray holes are disposed along a resonance direction of a semiconductor laser element disposed in the disposition region, and the discharge path extends in a direction intersecting with the resonance direction of the semiconductor laser element disposed in the disposition region.
H01S 5/024 - Dispositions pour la gestion thermique
H01S 5/34 - Structure ou forme de la région active; Matériaux pour la région active comprenant des structures à puits quantiques ou à superréseaux, p.ex. lasers à puits quantique unique [SQW], lasers à plusieurs puits quantiques [MQW] ou lasers à hétérostructure de confinement séparée ayant un indice progressif [GRINSCH]
H01S 5/02315 - Supports; Boîtiers Éléments de montage, p.ex. embases Éléments de support, p.ex. bases ou montures
An optical module includes: a mirror unit including a mirror device including a movable mirror portion provided with a coil; and a magnet unit including a first magnet, a second magnet, and a third magnet arranged along a first direction, and generating a magnetic field acting on the movable mirror portion. The mirror unit is disposed on the magnet unit in a second direction perpendicular to the first direction, and has a bottom surface facing the magnet unit. A protrusion portion protruding to a magnet unit side is formed on the bottom surface. A width of the protrusion portion in the first direction is equal to or less than a width of the first magnet in the first direction. The mirror unit is fixed to an upper surface of the first magnet at the protrusion portion.
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
94.
RADIATION DETECTOR, RADIATION DETECTOR MANUFACTURING METHOD, AND SCINTILLATOR PANEL UNIT
A radiation detector includes a sensor panel having a light receiving surface, a first scintillator panel and a second scintillator panel disposed on the light receiving surface in a state of being adjacent to each other along the light receiving surface, and a moisture-proof layer. The first scintillator panel has a first substrate and a first scintillator layer including a plurality of columnar crystals. The second scintillator panel has a second substrate and a second scintillator layer including a plurality of columnar crystals. The first scintillator layer reaches at least a first portion of the first substrate. The second scintillator layer reaches at least a second portion of the second substrate. The moisture-proof layer is provided continuous over the first scintillator panel and the second scintillator panel.
This radiation detector comprises a plurality of pixel circuits which are provided corresponding to a plurality of pixels arranged along a predetermined direction, and which each have at least one detection system for reading carriers from the corresponding pixel. The at least one detection system has a counter that counts the number of radiation hits, a first register that holds first data that is a count value from the counter, a second register that holds second data, an adder that generates third data by adding the first data and the second data, and a third register that holds third data. In each of the plurality of pixel circuits, the second data is third data transferred from the third register of the corresponding pixel circuit for a pixel that is adjacent to the corresponding pixel of the pixel circuit.
A metasurface element includes a support body and a metasurface formed on a surface of the support body. The metasurface includes a metal pattern that is disposed to emit an electron in response to incidence of an electromagnetic wave, and a metal layer that contains an alkali metal and is formed on the metal pattern. The metal layer extends beyond the metal pattern to reach a region on the surface of the support body, the region being not formed with the metal pattern.
A light detection device includes: a Fabry-Perot interference filter provided with a light transmission region; a light detector configured to detect light transmitted through the light transmission region; a package having an opening and accommodating the Fabry-Perot interference filter and the light detector; and a light transmitting unit arranged on an inner surface of the package so as to close an opening, the light transmitting unit including a band pass filter configured to transmit light incident on the light transmission region. When viewed from a direction parallel to the line, an outer edge of the Fabry-Perot interference filter is positioned outside an outer edge of the opening, and an outer edge of the light transmitting unit is positioned outside the outer edge of the Fabry-Perot interference filter.
G01J 3/26 - Production du spectre; Monochromateurs en utilisant une réflexion multiple, p.ex. interféromètre de Fabry-Perot, filtre à interférences variables
G02B 26/00 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables
G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives
G01J 5/20 - Pyrométrie des radiations, p.ex. thermométrie infrarouge ou optique en utilisant des détecteurs électriques de radiations en utilisant des éléments résistants, thermorésistants ou semi-conducteurs sensibles aux radiations, p.ex. des dispositifs photoconducteurs
G02F 1/21 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p.ex. commutation, ouverture de porte ou modulation; Optique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur par interférence
H01L 31/02 - Dispositifs à semi-conducteurs sensibles aux rayons infrarouges, à la lumière, au rayonnement électromagnétique d'ondes plus courtes, ou au rayonnement corpusculaire, et spécialement adaptés, soit comme convertisseurs de l'énergie dudit rayonnement e; Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives; Leurs détails - Détails
H01L 31/0232 - Dispositifs à semi-conducteurs sensibles aux rayons infrarouges, à la lumière, au rayonnement électromagnétique d'ondes plus courtes, ou au rayonnement corpusculaire, et spécialement adaptés, soit comme convertisseurs de l'énergie dudit rayonnement e; Procédés ou appareils spécialement adaptés à la fabrication ou au traitement de ces dispositifs ou de leurs parties constitutives; Leurs détails - Détails Éléments ou dispositions optiques associés au dispositif
H01L 31/0304 - Matériaux inorganiques comprenant, à part les matériaux de dopage ou autres impuretés, uniquement des composés AIIIBV
Positron emission tomography scanners [PET devices] and their parts and accessories including examination tables and pads; positron emission tomography scanners [PET devices] for the head and their parts and accessories including examination tables and pads; magnetic resonance imaging [MRI] scanners; magnetic resonance tomography apparatus; electroencephalographs for medical purposes; magnetoencephalography apparatus; imaging apparatus for medical purposes; medical apparatus and instruments.
Medical apparatus and instruments for use in positron emission tomography (PET) imaging; medical apparatus and instruments for use in positron emission tomography (PET) imaging used to monitor brain; downloadable software for recording, processing and transmitting medical data, sold as a component of positron emission tomography scanners (PET devices); medical diagnostic imaging apparatus.
Containers of metal for storage or transport; pre-fabricated metal building assembly kits; industrial packaging containers of metal. Medical apparatus and instruments for use in positron emission tomography (PET) imaging; medical apparatus and instruments for use in positron emission tomography (PET) imaging used to monitor brain; downloadable software for recording, processing and transmitting medical data, sold as a component of positron emission tomography scanners (PET devices); medical diagnostic imaging apparatus.
