2023
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Invention
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Automated analysis device.
This automated analysis device is provided with a plurality of analys... |
2021
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Invention
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Method of washing an aspiration probe of an in-vitro diagnostic system, in-vitro diagnostic metho... |
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Invention
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Automated analyzer and automated analysis method.
An automated analyzer includes two or more typ... |
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Invention
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Charged particle beam apparatus. An object of the present disclosure is to provide a charged part... |
2020
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Invention
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Interlock unit and automated analyzer equipped with same. Provided is an interlock unit which can... |
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Invention
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Automatic analyzing device. This automatic analyzing device is equipped with an interlock unit ha... |
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Invention
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Charged particle beam apparatus.
An object of the present disclosure is to provide a charged par... |
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Invention
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Medical material transport system. The present invention realizes a medical material transport sy... |
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Invention
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Light guide, detector having light guide, and charged particle beam device. a light guide. The li... |
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Invention
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Height measuring device and beam irradiation device. An object of the present disclosure is to pr... |
2019
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Invention
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Alignment system and position adjusting seal. The present invention implements an alignment syste... |
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Invention
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Genome assembly method, non-transitory computer readable medium, and genome assembly device.
Pro... |
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Invention
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Automated analyzer. Provided is an automated analyzer comprising an ultrasonic cleaner capable of... |
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Invention
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Plasma processing method and plasma processing device. Provided is a plasma processing method in ... |
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Invention
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Plasma processing apparatus and inner component of plasma processing apparatus and manufacturing ... |
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Invention
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Plasma processing device, internal member for plasma processing device, and method for manufactur... |
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Invention
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Method for monitoring gas component, device therefor, and processing device using same. This gas ... |
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Invention
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Semiconductor manufacturing device. The present invention provides a semiconductor manufacturing ... |
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Invention
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Dry etching method and dry etching apparatus. In this dry etching method using plasma, when etchi... |
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Invention
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Plasma treatment device. Provided is a plasma treatment device comprising: a treatment chamber wh... |
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Invention
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Etching processing device, etching processing method and detector. In film thickness/depth measur... |
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Invention
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Method for operating vacuum processing device. Provided is a technique which pertains to a method... |
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Invention
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Etching method and plasma treatment device. The present invention enables high-accuracy etching w... |
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Invention
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Automatic analyzer.
An automatic analyzer which accurately detects a liquid volume of a reagent ... |
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Invention
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Automatic analyzer. In the case of adopting a configuration in which reagent bottles are radially... |
2018
|
Invention
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Plasma processing device and method for processing sample using same.
There is provided a sample... |
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Invention
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Plasma processing device and sample processing method using same. In order to enable a wafer to b... |
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Invention
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Specimen processing system.
Provided is a specimen processing system which can contribute to spa... |
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Invention
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Specimen processing system.
A specimen processing system comprising a pre-processing device perf... |
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Invention
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Plasma treatment device, and method for treating sample for treatment using same. A method for tr... |
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P/S
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Hand-held, portable measuring and testing apparatus for chemical composition analysis, namely, el... |
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Invention
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Pattern measurement method, measurement system, and computer-readable medium. The present disclos... |
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Invention
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Automated analysis device. This automated analysis device is provided with a plurality of analysi... |
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Invention
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Electrophoresis device. The present invention addresses the problem of improving analysis perform... |
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Invention
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Charged particle beam device, autofocus processing method for charged particle beam device, and d... |
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Invention
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Biochemical cartridge and biochemical analysis device. In order to enable a biological sample to ... |
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Invention
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Biochemical cartridge and biochemical analysis device. Several kV of applied voltage are required... |
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Invention
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Charged particle beam system. A control system for this charged particle beam system obtains a fi... |
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Invention
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Automated analyzer and automated analysis method. The present invention makes it possible for an ... |
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Invention
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Automated analyzer. The present invention reduces the turnaround time of an automated analyzer. D... |
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Invention
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Automatic analysis apparatus.
A driving mechanism for moving a vessel having a disposal box plac... |
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Invention
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Automated analyzer and image processing method. This automated analyzer comprises: a sample disk ... |
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Invention
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Apparatus, method for determining state of sample, and analysis system. A state of a sample surfa... |
2017
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Invention
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Pattern measurement device and pattern measurement method. The present invention has a computatio... |
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Invention
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Defect classification device, inspection device, and inspection system. In order to prevent an er... |
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Invention
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Charged particle beam device. The present invention provides a charged particle beam apparatus ca... |
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Invention
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Charged particle beam apparatus. The present invention realizes a composite charged particle beam... |
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Invention
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Far-infrared spectroscopic device and far-infrared spectroscopic method. In an is-TPG method in w... |
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Invention
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Capillary electrophoresis device. An electrophoresis device has: a sample tray (112) on which the... |
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Invention
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Apparatus and method for storing thin film device and method for measuring biological molecule. (... |
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P/S
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Comprehensive preventative maintenance services for critical dimension-scanning electron microsco... |
2014
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P/S
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Metrology software for use in the manufacturing of semiconductors; software for the evaluation an... |
2013
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P/S
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Electron microscopes, microscopes, focused ion beam analyzers for transmission and scanning elect... |
2008
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P/S
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Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in... |
2007
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P/S
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Semiconductor wafer processing machines |
2004
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P/S
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[Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use i... |