Applied Materials, Inc.

États‑Unis d’Amérique


 
Quantité totale PI 16 574
Quantité totale incluant filiales 18 519 (+ 1 993 pour les filiales)
Rang # Quantité totale PI 49
Note d'activité PI 4,6/5.0    12 847
Rang # Activité PI 36
Activité incl filiales 4,5/5.0    13 418
Symbole boursier
ISIN US0382221051
Capitalisation 67,399M  (USD)
Industrie Semiconductor Equipment & Materials
Secteur Technology
Classe Nice dominante Appareils et instruments scienti...

Brevets

Marques

8 526 343
0 26
7 434 222
23
 
Dernier brevet 2024 - Compensation for slurry composit...
Premier brevet 1974 - Induction heated vapor source
Dernière marque 2024 - JAVELIN
Première marque 1981 - PROMIS

Filiales

16 subsidiaries with IP (1959 patents, 34 trademarks)

30 subsidiaries without IP

 S'inscrire grtuitement pour accéder à la liste des filiales

Industrie (Classification de Nice)

Derniers inventions, produits et services

2024 P/S Semiconductor wafer processing equipment used for implanting different materials into wafers
P/S Semiconductor processing chamber used to deposit materials on substrates
P/S Semiconductor manufacturing software used to provide wafer doping uniformity
P/S Semiconductor manufacturing equipment used to remove material from wafers
P/S Semiconductor manufacturing equipment used to deposit metal on wafers
P/S Semiconductor manufacturing equipment used to remove material from substrates
P/S Semiconductor manufacturing equipment used to deposit materials on substrates
P/S Charitable services, namely, providing financial support to women college students in STEM areas ...
P/S Software-controlled systems used in the semiconductor manufacturing industry, namely, recorded s...
P/S Charitable services, namely, providing financial support to women college students in STEM areas...
P/S Providing a website and electronic publications featuring information about the environment, clim...
P/S Equipment used to inspect semiconductor wafers for defects
2023 Invention Freeform optical substrates in waveguide displays. Embodiments of the present disclosure general...
Invention Integrated optical sensor controller for devicemanufacturing machines. Implementations disclosed...
Invention Method to measure light loss of optical films and optical substrates. A method of optical device...
Invention In-line monitoring of oled layer thickness and dopant concentration. An organic light-emitting d...
Invention Multi-step process for flowable gap-fill film. Generally, examples described herein relate to me...
Invention High resolution advanced oled sub-pixel circuit and patterning method. Embodiments described her...
Invention High-k dielectric materials comprising zirconium oxide utilized in display devices. Embodiments ...
P/S Semiconductor inspection system used to inspect pharmaceutical products for defects
P/S Eco-efficient semiconductor wafer processing equipment Software-controlled, eco-efficient systems...
Invention Switching control algorithms on detection of exposure of underlying layer during polishing. A me...
Invention Evaporation apparatus, vapor deposition apparatus, and evaporation method. An evaporation appara...
Invention Growth monitor system and methods for film deposition. The present disclosure generally relates ...
Invention Ion implantation to modify glass locally for optical devices. Embodiments described herein provi...
P/S Optical devices for high performance photonic applications
P/S Downloadable and/or recorded software for use in processing semiconductor wafer patterns and rec...
P/S Downloadable and/or recorded software for use in wafer-less patterning of semiconductors.
P/S Downloadable and/or recorded software for use in managing wafer fabrication recipes.
P/S Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including pa...
P/S Equipment for testing chemical delivery systems including ampoules or containers Downloadable and...
P/S Downloadable and/or recordable software for creating semiconductor fabrication recipes
P/S Electron beam tool, namely, optical defect inspection equipment in the nature of an electron micr...
P/S Equipment for chemical delivery systems including ampoules or containers
P/S Downloadable and/or recorded software for use in processing semiconductor metrology data and fab...
P/S Recorded software for use in managing semiconductor wafer fabrication recipes.
P/S Recorded software for use in semiconductor metrology.
P/S Battery films; lithium ion battery films. Treatment and processing of battery films.
P/S Treatment of materials, namely, mechanical, chemical and physical treatment of semiconductor mat...
Invention Total or local thickness variation for optical devices. Embodiments of the present disclosure ge...
Invention Determining substrate profile properties using machine learning. Spectral data associated with a ...
Invention Methods and systems for a spectral library at a manufacturing system. Spectral data associated wi...
Invention Sacrificial source/drain for metallic source/drain horizontal gate all around architecture. Semi...
Invention Inductively coupled plasma apparatus with novel faraday shield. An antenna assembly, comprising: ...
Invention Methods and systems for a spectral library at a manufacturing system. Spectral data associated w...
Invention Scaling for die-last advanced ic packaging. Embodiments of the present disclosure relate to a sy...
Invention Particle reduction in physical vapor deposition of amorphous silicon. Methods for depositing amor...
Invention Filter isolation for equipment front end module. Disclosed herein are systems and methods for red...
Invention Methods and apparatus for cooling a substrate support. Methods and apparatus for processing a sub...
Invention Dry etching with etch byproduct self-cleaning. A method includes providing, within an etch chambe...
P/S Semiconductor wafer processing equipment for modifying film properties of substrates
P/S Machines for the manufacturing, polishing and cleaning of semiconductor substrates, thin films, s...
Invention Bipolar electrostatic chuck for etch chamber. Embodiments of bipolar electrostatic chucks are pro...
P/S Educational services, namely, conducting seminars, lectures, tutorials, and workshops in the fie...
Invention Methods for forming dram devices without trench fill voids. Disclosed herein are approaches for ...
Invention Dielectric-on-dielectric selective deposition using aniline passivation. A method includes formin...
P/S Classes, seminars, lectures, tutorials, and other educational services for the use of software mo...
Invention Isotropic silicon nitride removal. Exemplary methods of etching a silicon-containing material may...
Invention Carbon replenishment of silicon-containing material. Exemplary methods of semiconductor processin...
P/S Semiconductor manufacturing equipment for depositing dielectric films and coatings.
P/S Lithium ion batteries; lithium ion battery separator films. Treatment and processing of lithium i...
P/S Semiconductor manufacturing equipment for depositing dielectric films and coatings.
Invention Rapid thermal processing (rtp) chamber outgassing removal. Embodiments disclosed herein include a...
Invention Bimetallic faceplate for substrate processing. A bimetallic faceplate for substrate processing is...
Invention Apparatus design for film removal from the bevel and edge of the substrate. Embodiments disclosed...
Invention Compensation for slurry composition in in-situ electromagnetic inductive monitoring. A method of...
Invention Rapid thermal processing (rtp) chamber outgassing removal. Embodiments disclosed herein include ...
Invention Apparatus design for film removal from the bevel and edge of the substrate. Embodiments disclose...
Invention Dry etching with etch byproduct self-cleaning. A method includes providing, within an etch chamb...
Invention Methods and precursor formulations for forming advanced polishing pads by use of an additive manu...
Invention Chambers and related methods and structures for batch cooling or heating. The present disclosure ...
Invention Halogen-resistant thermal barrier coating for processing chambers. A coating on a processing cham...
2022 Invention Cost effective radio frequency impedance matching networks. Embodiments provided herein generally...
Invention In-situ electric field detection method and apparatus. Embodiments of the disclosure include an e...
Invention Endpoint optimization for semiconductor processes. A camera may capture reflected light from the...
Invention Filter isolation for equipment front end module. Disclosed herein are systems and methods for re...
Invention Inductively coupled plasma apparatus with novel faraday shield. An antenna assembly, comprising:...
Invention Methods for forming dram devices without trench fill voids. Disclosed herein are approaches for f...
Invention Bottom contact formation for 4f2 vertical dram. Disclosed herein are approaches for forming cont...
Invention Dielectric on dielectric selective deposition using aniline passivation. A method includes formi...
Invention Halogen-resistant thermal barrier coating for processing chambers. A coating on a processing cha...
Invention Load lock chambers and related methods and structures for batch cooling or heating. The present ...
Invention Carbon replenishment of silicon-containing material. Exemplary methods of semiconductor processi...
Invention In-situ electric field detection method and apparatus. Embodiments of the disclosure include an ...
Invention Methods and apparatus for ruthenium oxide reduction on extreme ultraviolet photomasks. Methods a...