Quantité totale PI	143
Rang # Quantité totale PI	8 869
Note d'activité PI	2,8/5.0    99
Rang # Activité PI	7 055
Classe Nice dominante	Appareils et instruments scienti...

Brevets Marques 72 23 4 12 18 10 4
Dernier brevet	2024 - Spring pin tip
Premier brevet	1992 - Method of forming closely-spaced...
Dernière marque	2023 - KEEP EVOLVING
Première marque	2002 - JOHNSTECH

Industrie (Classification de Nice)

Derniers inventions, produits et services 2023 P/S Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for i... Invention Spring probe assembly for a kelvin testing system. A spring probe assembly for a Kelvin testing ... Invention Spring probe assembly for a kelvin testing system. A spring probe assembly for a Kelvin testing s... 2022 Invention Housing with vertical backstop. A contactor assembly for a testing system for testing integrated... Invention Housing with vertical backstop. A contactor assembly for a testing system for testing integrated ... P/S Engineering services related to test pins for testing circuit boards and integrated circuit chips... P/S Engineering services related to test pins for testing circuit boards and integrated circuit chip... P/S Test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for ... Invention Contact assembly and kelvin testing system having contact assembly. A contact assembly for a Kelv... Invention Contact assembly array and testing system having contact assembly array. A contact assembly for a... Invention Compliant ground block and testing system having compliant ground block. A compliant ground block... Invention Spring pin tip P/S Semiconductor testing apparatus; contacts for testing semiconductor devices; and apparatus for te... 2021 Invention Housing with anti-dislodge capability. A contactor assembly for a testing system is disclosed. Th... P/S test fixtures in the nature of apparatus for testing integrated circuits, contact test pins for i... Invention Over the air (ota) chip testing system. A test apparatus for testing device under test (DUT) havi... Invention Integrated circuit testing for integrated circuits with antennas. A testing system and method for... P/S semiconductor testing apparatus; contactor housing and alignment plate used for testing semicondu... 2020 P/S Probes for testing integrated circuits; test pins for testing printed circuit boards. P/S Probes for testing integrated circuits; test pins for testing printed circuit boards. P/S semiconductor testing apparatus; contacts for testing semiconductor devices Invention Integrated circuit contact test apparatus with and method of construction. A test socket for a de... P/S semiconductor testing apparatus; contactor housing and alignment plate material used for testing ... Invention Self flattening test socket with anti-bowing and elastomer retention. A high density thin walled ... P/S Probes for testing integrated circuits; Test pins for testing printed circuit boards Invention Integrated circuit contactor for testing ics and method of construction. The terminals of a devic... Invention Waveguide integrated circuit testing. A structure and method for providing a housing which includ... Invention High isolation contactor with test pin and housing for integrated circuit testing. A test socket ... 2019 Invention Tip for integrated circuit test pin Invention Waveguide integrated testing. A structure and method for providing a housing which includes a hig... Invention Electrically conductive kelvin contacts for microcircuit tester. Terminals (2, 502) of a device ... 2018 Invention Wafer level integrated circuit probe array and method of construction. A testing device for wafer... Invention Electrically conductive pins microcircuit tester. The terminals of a device under test (DUT) are ... Invention Testing apparatus and method for microcircuit testing with conical bias pad and conductive test p... Invention Selectively geometric shaped contact pin for electronic component testing and method of fabricati... Invention Constant pressure pin tip for testing integrated circuit chips. A structure and method of constru... Invention High isolation housing for testing integrated circuits. a, 48, 47 of electrically conductive stri... 2017 Invention Low resistance low wear test pin for test contactor. A contact for use in a test set which can be... Invention Electrically conductive pins for microcircuit tester. The terminals of a device under test are te... P/S Probe arrays and electrical contact pins for testing integrated circuit chips; integrated circui... Invention Resilient interposer with electrically conductive slide-by pins as part of a microcircuit tester.... Invention Manual test socket and method of adjustment. A test device for manually testing chips/ICs is disc... P/S Probe arrays and electrical contact pins for testing integrated circuit chips; integrated circuit... 2016 Invention Constant stress pin tip for testing integrated circuit chips. A structure and method of construct... 2014 Invention Electrically conductive pins for load boards lacking kelvin capability for microcircuit testing. ... 2013 P/S Probe arrays for testing integrated circuit chips Engineering services related to testing on a pr... 2012 P/S Electrical test appraratus; test fixtures in the nature of apparatus for testing integrated circu... 2010 P/S Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, sig... 2009 P/S test fixtures in the nature of apparatus for testing integrated circuits; contact test pins for i... 2006 P/S EXPEDITED CATALOG AND ON-LINE ORDERING SERVICES FEATURING ELECTRONIC COMPONENTS 2002 P/S Integrated circuit test sockets and components thereof. P/S INTEGRATED CIRCUIT TEST SOCKETS AND COMPONENTS THEREOF