- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
Patent holdings for IPC class G01N 23/20
Total number of patents in this class: 1136
10-year publication summary
111
|
105
|
119
|
88
|
58
|
57
|
70
|
44
|
34
|
2
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Rigaku Corporation | 416 |
49 |
Bruker AXS, Inc. | 41 |
20 |
Koninklijke Philips N.V. | 23971 |
19 |
Commissariat à l'énergie atomique et aux energies alternatives | 10694 |
19 |
Shimadzu Corporation | 6010 |
15 |
Konica Minolta, Inc. | 8530 |
14 |
Rapiscan Systems, Inc. | 296 |
13 |
KLA Corporation | 1400 |
13 |
Morpho Detection, LLC | 105 |
12 |
Centre National de La Recherche Scientifique | 10091 |
11 |
KLA-Tencor Corporation | 2550 |
11 |
Sigray, Inc. | 72 |
11 |
Malvern PANalytical B.V. | 127 |
11 |
Halliburton Energy Services, Inc. | 20419 |
10 |
LG Chem, Ltd. | 17637 |
10 |
Canon Inc. | 38114 |
10 |
Bruker AXS GmbH | 47 |
10 |
Paul Scherrer Institut | 299 |
10 |
Saudi Arabian Oil Company | 12423 |
10 |
Vib VZW | 844 |
10 |
Other owners | 848 |