eMemory Technology Inc.

Taiwan, Province of China


 
Total IP 358
Total IP Rank # 3,477
IP Activity Score 3/5.0    196
IP Activity Rank # 3,533
Stock Symbol 3529 (tpex)
ISIN TW0003529004
Market Cap. 175.0B  (TWD)
Industry Semiconductor Memory
Sector Technology
Dominant Nice Class Scientific, technological and in...

Patents

Trademarks

347 8
0 0
0 0
3
 
Last Patent 2024 - Fault-injection protection circu...
First Patent 1998 - Fabricating method of an ultra-f...
Last Trademark 2016 - NEOPUF
First Trademark 2002 - NEOBIT

Industry (Nice Classification)

Latest Inventions, Goods, Services

2023 Invention Fault-injection protection circuit for protecting against laser fault injection. A fault-injecti...
Invention Level shifter with voltage stress durability and method for driving the same. A level shifter in...
Invention Programming method of non-volatile memory cell. A programming method of a non-volatile memory ce...
Invention One time programming memory cell with fin field-effect transistor using physically unclonable fun...
Invention One time programming memory cell with gate-all-around transistor for physically unclonable functi...
Invention Short channel effect based random bit generator. A random bit generator includes a voltage sourc...
Invention Selection circuit. A selection circuit includes a main selection circuit and an auxiliary select...
Invention Electrostatic discharge circuit. An ESD circuit includes a first P-type transistor, a second P-t...
Invention Erasable programmable non-volatile memory cell. A non-volatile memory cell includes a p-type wel...
Invention Voltage level shifter and operation method thereof. A voltage level shifter includes an input tr...
Invention Antifuse-type one time programming memory cell with gate-all-around transistor. An antifuse-type...
Invention Manufacturing method for nonvolatile charge-trapping memory apparatus. A manufacturing method fo...
Invention Memory cell and array structure of non-volatile memory and associated control method. A memory c...
Invention Resistive memory cell and associated cell array structure. A resistive memory cell includes a P-...
Invention Memory cell of charge-trapping non-volatile memory. A memory cell of a charge-trapping non-volat...
2022 Invention Non-volatile memory and voltage detecting circuit thereof. A voltage detecting circuit for a non...
Invention Charge pump apparatus and calibration method thereof. A charge pump apparatus includes a first ch...
Invention Sensing device for non-volatile memory. A sensing device for a non-volatile memory includes a re...
Invention Non-volatile memory cell and non-volatile memory cell array. A non-volatile memory cell includes...
Invention Erasable programmable single-ploy non-volatile memory cell and associated array structure. An er...
Invention Forming control method applied to resistive random-access memory cell array. A forming control m...
Invention Driving circuit for non-volatile memory. A driving circuit includes a cross coupled circuit, a f...
Invention Method for manufacturing semiconductor structure and capable of controlling thicknesses of oxide ...
Invention Program control circuit for antifuse-type one time programming memory cell array. A program contr...
Invention Magnetoresistive random access memory for physically unclonable function technology and associate...
Invention High voltage switch device. A switch device includes a P-type substrate, a first gate structure, ...
Invention Resistive memory device and forming method thereof with improved forming time and improved formin...
Invention Differential memory cell array structure for multi-time programming non-volatile memory. A diffe...
Invention Erasable programmable single-poly non-volatile memory cell and associated array structure. An era...
Invention Fuse-type one time programming memory cell. A fuse-type one time programming memory cell include...
Invention Stacked-gate non-volatile memory cell. A stacked-gate non-volatile memory cell includes a semico...
2021 Invention Memory device having reference memory array structure resembling data memory array structure, and...
Invention Antifuse-type one time programming memory cell and cell array structure with same. An antifuse-ty...
Invention Integrated circuit with capability of inhibiting esd zap. An integrated circuit is provided. An E...
Invention Memory device for improving weak-program or stuck bit. Provided is a memory device including a me...
Invention Anti-fuse memory device, memory array, and programming method of an anti-fuse memory device for p...
Invention Resistive memory cell and associated cell array structure. A cell array structure includes a fir...
Invention Memory structure and operation method thereof. A memory structure including a substrate, a gate s...
Invention Memory device capable of improving erase and program efficiency. A memory device includes a first...
Invention Charge pump circuit capable of generating voltages in erasing operation, program operation and re...
Invention Memory cell of non-volatile memory. A memory cell of a non-volatile memory includes a memory elem...
Invention Charge pump apparatus and calibration method thereof. A charge pump apparatus including a first c...
Invention Non-volatile memory with multi-level cell array and associated program control method. A non-vola...
Invention Level shifter. A level shifter includes a self-initialization circuit. The self-initialization ci...
Invention Sensing circuit and method for multi-level memory cell. A sensing circuit includes a cell clock g...
Invention Memory device and method for operating memory device. A memory device includes a well, a poly lay...
Invention Write voltage generator for non-volatile memory. A write voltage generator is connected with a ma...
Invention Memory cell array of programmable non-volatile memory. A memory cell of a memory cell array inclu...
2020 Invention Programming and verifying method for multilevel memory cell array. A programming and verifying me...
2016 G/S Semiconductor chips and semiconductor devices, all for use in computing devices, communication pr...
2012 G/S Design and testing of integrated circuits for others; testing and analysis of integrated circuits...