Advantest Corporation

Japon


 
Quantité totale PI 1 931
Quantité totale incluant filiales 1 955 (+ 24 pour les filiales)
Rang # Quantité totale PI 632
Note d'activité PI 3,4/5.0    516
Rang # Activité PI 1 417
Activité incl filiales 3/5.0    520
Symbole boursier
ISIN JP3122400009
Capitalisation 1871706445700.0  (JPY)
Industrie Semiconductor Equipment & Materials
Secteur Technology
Classe Nice dominante Appareils et instruments scienti...

Brevets

Marques

944 13
0 5
958 9
2
 
Dernier brevet 2024 - Magnetically retained replaceabl...
Premier brevet 1978 - Apparatus for keying in electron...
Dernière marque 2021 - VGEM
Première marque 1981 - ADVANTEST

Filiales

3 subsidiaries with IP (24 patents, 0 trademarks)

1 subsidiaries without IP

 S'inscrire grtuitement pour accéder à la liste des filiales

Industrie (Classification de Nice)

Derniers inventions, produits et services

2023 Invention Testing apparatus, testing method, and computer-readable storage medium. Provided is a testing a...
Invention Test system configuration adapter systems and methods. Presented embodiments facilitate efficien...
Invention System and method for reserving cloud-based instrument. A method for reserving a cloud-based ins...
Invention Automated test equipment comprising a device under test loopback and an automated test system wit...
Invention Over the air (ota) testing of an antenna in package (aip) device in radiating near field using a ...
Invention Magnetically retained replaceable cylinder component for pick-and-place test head unit. Embodimen...
Invention Magnetically retained replaceable chuck assembly for pick-and-hold test head unit. Embodiments of...
Invention Pore device and fine particle measurement system. A pore device is used with a measurement devic...
Invention Magnetically retained replaceable cylinder component for pick-and-place test head unit. Embodime...
Invention Magnetically retained replaceable chuck assembly for pick-and-hold test head unit. Embodiments o...
Invention Electronic component testing apparatus, sockets, and replacement parts for electronic component t...
Invention Signal generator. N (N≥2) D/A converters convert respective input data at a sampling frequency F...
Invention Semiconductor apparatus and method for manufacturing semiconductor apparatus. To provide a semic...
Invention Stacked chip and fabrication method of stacked chip. A stacked chip is provided comprising a fir...
Invention Processor test pattern generation and application for tester systems. A tester system includes a...
Invention Testing apparatus, testing system, testing method, and testing program. Provided is a testing app...
Invention Low power environment for high performance processor without low power mode. A tester system inc...
Invention Memory queue operations to increase throughput in an ate system. A tester system includes a test...
Invention Automatic test equipment. An interface device is provided between a test head and a DUT. The int...
Invention Automatic test equipment. An interface device is provided between a test head and a device under...
Invention Automatic test equipment. An interface apparatus is provided between a test head and a DUT. The ...
Invention Automatic test equipment. An interface device is provided between a test head and a DUT. In the ...
Invention Apparatus for testing a device under test separating errors within a received pattern associated ...
Invention Heater drive controlling apparatus, electronic component handling apparatus, electronic component...
Invention Test arrangement for over-the-air testing an angled device under test in a device-under-test sock...
Invention Test arrangement for over-the-air testing an angled device under test using a carrier structure w...
Invention Test arrangement for over-the-air testing an angled device under test that is tilted relative to ...
Invention Ultrasonic measurement apparatus, method, and recording medium. An ultrasonic measurement appara...
Invention Management of hot add in a testing environment for duts that are cxl protocol enabled. Efficient...
Invention Cxl protocol enablement for test environment systems and methods. Efficient and effective testin...
Invention Systems and methods for testing cxl enabled devices in parallel. Efficient and effective testing...
Invention Systems and methods utilizing dax memory management for testing cxl protocol enabled devices. Ef...
Invention Signal/noise determination apparatus, method, and recording medium. A signal/noise determination...
Invention Systems and methods of testing devices using cxl for increased parallelism. Embodiments of the p...
2022 Invention Optical waveguide and method for manufacturing optical waveguide. Provided is an optical waveguid...
Invention Automated test equipment, method for testing a device under test and computer program using a fit...
Invention Automated test equipment, method for testing a device under test and computer program using an it...
Invention An antenna device and an automated test equipment. The invention describes an antenna device, com...
Invention A pusher for use in an automated test equipment and method for mechanically pushing a device unde...
Invention A pusher and a method for pushing a device under test with a single-linearly polarized antenna in...
Invention Amplifier arrangement and method for amplifier arrangement with set current at control input of t...
Invention Connecting device, testing device, and communication device. This connecting device comprises a f...
Invention Heat exchanger, electronic component handling device, and electronic component testing device. A ...
Invention Optical circuit and method. Provided is an optical circuit (10) equipped with: an optical switch ...
Invention Photoacoustic wave measurement device, method, program, and recording medium. In the present inve...
Invention Bias circuit. In the present invention, a frequency band on the low-frequency side of an output o...
Invention Optical element. The present invention decreases resistance between an electrode and a slot (rece...
Invention Signal vector derivation apparatus, method, program, and recording medium. A signal vector deriv...
Invention Magnetic field measuring apparatus. A magnetic field measuring apparatus for measuring a to-be-m...
2021 P/S Downloadable and recorded computer software for controlling the operation of semiconductor testin...
P/S Computer software for controlling the operation of semiconductor testing machines.
2020 Invention Electronic component handling apparatus, electronic component testing apparatus, electronic compo...
P/S Semiconductor testing machines; system large scale integrated circuits testing machines; large sc...
P/S Semiconductor testing machines; system large scale integrated circuits testing machines; large s...
2018 P/S Wireless data loggers; temperature indicators; strain gauges; voltmeters; hygrometers; pressure g...
P/S Measuring or testing machines and instruments; computer software; wireless data loggers; tempera...
2016 P/S Photoacoustic microscope.
2013 P/S Rental of semiconductor testing machines and system and their parts and fitting; design, install...
P/S Rental of semiconductor testing machines and system and their parts and fitting; design, installa...
2012 P/S Machines to test semiconductors, machines to test system large scale integrated circuits, machine...
P/S Optical inspection apparatus for inspection and testing of semiconductor materials, namely, phot...
P/S Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo...
2010 P/S Computer software used for the operation and control of photomask inspection and testing machines...
P/S Computer software for photomask inspection or testing machines and systems; computer software; p...
2007 P/S Semiconductor testing machines, system large scale integrated circuits testing machines, large sc...
P/S Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in...
2006 P/S Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument...
P/S Test systems and platforms consisting of computer hardware, firmware, software and instruments fo...
2005 P/S Measuring or testing machines and instruments; electric or magnetic meters and testers; telecomm...
P/S Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e...
2001 P/S [MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE...
2000 P/S Semiconductor manufacturing machines, integrated circuit manufacturing machines
P/S Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ...
1998 P/S Computer software used for data conversion, namely, for converting information developed in the d...
1992 P/S LSI test systems, namely, groupings of equipment for testing the function and performance of elec...
1985 P/S Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy...
1981 P/S Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large...