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2023
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Invention
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Automated test equipment and method using a trigger generation.
An automated test equipment comp... |
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2022
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Invention
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Apparatus for testing a component, method of testing the component, computer-readable storage dev... |
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Invention
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Integrated circuit, an apparatus for testing an integrated circuit, a method for testing an integ... |
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Invention
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Automated test equipment and method using device specific data.
An automated test equipment comp... |
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Invention
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Circuit and method for claibrating a plurality of automated test equipment channels.
A circuit f... |
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Invention
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Automated test equipment for testing one or more devices-under-test and method for operating an a... |
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Invention
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Systems and methods for multidimensional dynamic part average testing. Embodiments of the present... |
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Invention
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Electronic component testing apparatus, socket, and carrier.
An electronic component testing app... |
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Invention
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Frequency range conversion.
Frequency ranges may be converted by an apparatus including a conver... |
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Invention
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Distortion display apparatus, method, and recording medium.
A distortion display apparatus inclu... |
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Invention
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Semiconductor device.
A semiconductor device includes a power supply and ground layer and a semi... |
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Invention
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Frequency selective electrical filter.
Embodiments of the present invention provide an electrica... |
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Invention
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Fabrication method of stacked device and stacked device.
Provided is a stacked device comprising... |
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Invention
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Determination apparatus, test system, determination method, and computer- readable medium.
There... |
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Invention
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Calibration device, conversion device, calibration method, and non-transitory computer-readable m... |
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Invention
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Determining performance metrics for a device under test using nearfield measurement results.
Emb... |
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Invention
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Measurement apparatus, measurement method and computer readable medium.
Provided is a measuremen... |
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Invention
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Testing apparatus, testing method, and program. Provided is a testing apparatus comprising: a lig... |
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Invention
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Protective circuit and switch control device. 1211211211) and that include a resistor having a se... |
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Invention
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Measurement apparatus and measurement method.
A measurement apparatus comprising: a clock genera... |
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Invention
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Signal generator and discretionary waveform generation method. S1NiSi1NN that have different freq... |
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Invention
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Burn-in board and burn-in apparatus.
A burn-in board includes: a board; sockets mounted on the b... |
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Invention
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Burn-in board and burn-in apparatus.
A burn-in board includes: a board; a socket mounted on the ... |
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Invention
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Test apparatus of antenna array.
A test apparatus inspects an antenna element or a device includ... |
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Invention
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Signal measurement device and periodic signal measurement method. 12n12n000012n12n12nn is satisfi... |
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Invention
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Multi-channel clock generator. A clock generator 100 is provided with a plurality, N, of PLL circ... |
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Invention
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Raw milk measuring instrument. [Problem] To measure the viscosity of raw milk. [Solution] A raw m... |
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Invention
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Raw milk measuring instrument and method for manufacturing same. [Problem] To reduce the burden o... |
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Invention
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Signal vector deriving device, method, program, and recording medium. [Problem] To improve the me... |
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Invention
|
Test equipment for testing a device under test having an antenna.
Devices for testing a DUT havi... |
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Invention
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Test carrier and electronic component testing apparatus. A test carrier that accommodates a DUT a... |
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Invention
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Magnetic field measuring instrument. [Problem] To reduce labor for setting a range within which a... |
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2021
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Invention
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Electronic component handling apparatus and electronic component testing apparatus. An electronic... |
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Invention
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Temperature adjustment device and electronic component testing device. This temperature adjustmen... |
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Invention
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Temperature adjustment system and electronic component test device. 22 supply source 200 that sup... |
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Invention
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Automated test equipment, device under test, test setup methods using a trigger line. An automate... |
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Invention
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Automated test equipment, device under test, test setup methods using a measurement request. An a... |
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Invention
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Automated test equipment, device under test, test setup methods using an acknowledge signaling. A... |
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Invention
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Test carrier.
A test carrier that accommodates a device under test (DUT) and has a through-hole ... |
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Invention
|
Systems and methods for multidimensional dynamic part average testing.
Embodiments of the presen... |
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Invention
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Control devices for controlling an automated test equipment (ate), ate, methods for controlling a... |
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P/S
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Downloadable and recorded computer software for controlling the operation of semiconductor testin... |
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P/S
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Computer software for controlling the operation of
semiconductor testing machines. |
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Invention
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Measurement arrangement, measurement setup, measurement system and method for determining a beamf... |
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Invention
|
A multi-section directional coupler, a method for manufacturing a multi-section directional coupl... |
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Invention
|
Circuit and method for calibrating a plurality of automated test equipment channels. A circuit fo... |
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Invention
|
Filtering apparatus, method, program, and recording medium.
According to the present invention, ... |
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2020
|
Invention
|
Optical testing apparatus.
An optical testing apparatus is used in testing an optical measuring ... |
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Invention
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Biosensor, channel member used in biosensor, and method of using biosensor.
A biosensor includes... |
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P/S
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Semiconductor testing machines; system large scale integrated circuits testing machines; large sc... |
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P/S
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Semiconductor testing machines; system large scale
integrated circuits testing machines; large s... |
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Invention
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Somatic cell meter, somatic cell measuring method, program, and recording medium.
According to t... |
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Invention
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Identification information readout apparatus, method, program, recording medium, and measuring sy... |
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2018
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P/S
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Wireless data loggers; temperature indicators; strain gauges; voltmeters; hygrometers; pressure g... |
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P/S
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Measuring or testing machines and instruments; computer
software; wireless data loggers; tempera... |
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2016
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P/S
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Photoacoustic microscope. |
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2013
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P/S
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Rental of semiconductor testing machines and system and
their parts and fitting; design, install... |
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P/S
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Rental of semiconductor testing machines and system and their parts and fitting; design, installa... |
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2012
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P/S
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Machines to test semiconductors, machines to test system large scale integrated circuits, machine... |
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P/S
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Optical inspection apparatus for inspection and testing of
semiconductor materials, namely, phot... |
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P/S
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Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo... |
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2010
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P/S
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Computer software used for the operation and control of photomask inspection and testing machines... |
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P/S
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Computer software for photomask inspection or testing
machines and systems; computer software; p... |
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2007
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P/S
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Semiconductor testing machines, system large scale integrated circuits testing machines, large sc... |
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P/S
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Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in... |
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2006
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P/S
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Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument... |
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P/S
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Test systems and platforms consisting of computer hardware, firmware, software and instruments fo... |
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2005
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P/S
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Measuring or testing machines and instruments; electric or
magnetic meters and testers; telecomm... |
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P/S
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Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e... |
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2001
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P/S
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[MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE... |
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2000
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P/S
|
Semiconductor manufacturing machines, integrated circuit manufacturing machines |
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P/S
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Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ... |
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1998
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P/S
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Computer software used for data conversion, namely, for converting information developed in the d... |
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1992
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P/S
|
LSI test systems, namely, groupings of equipment for testing the function and performance of elec... |
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1985
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P/S
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Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy... |
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1981
|
P/S
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Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large... |
